Specifications

University of Pretoria etd – Combrinck, M (2006)
model than the three layer inversion. This is to be expected as the basic assumption of an
infinite layer (in horizontal extent) is violated.
MODEL 5: Conductive prism in half space
Half space resistivity (conductivity) 50 ohm.m (0.02 S/m)
Prism resistivity (conductivity) 5 ohm.m (0.2 S/m)
Prism dimensions (horizontal) 200m X 200m
Prism thickness (vertical) 200m
Prism depth to top 150m
0.001
0.01
0.1
1
0 50 100 150 200 250 300 350 400 450 500
Depth [m]
Apparent conductivity [S/m]
Input model
SLDT: no depth factor
SLDT: depth factor 1
SLDT: depth factor 2
SLDT: depth factor 3
TEMIX 3L inversion
TEMIX 10L smooth inversion
Figure 4-23: Comparison of S-layer differential transform (SLDT) solutions using different
depth factors and layered earth inversions of synthetic data for a conductive prism in a resistive
half space.
The depth to top of a conductive prism is well defined by the layered earth inversion as
well as the correction factor 3 results.
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