Specifications

University of Pretoria etd – Combrinck, M (2006)
in cumulative conductance with time can be mapped again (Figure 4-2 bottom). This
behaviour is investigated in more detail in the next section.
MODEL 4: Conductive plate in half space
Half space resistivity (conductivity) 50 ohm.m (0.02 S/m)
Plate resistivity (conductivity) 5 ohm.m (0.2 S/m)
Plate dimensions (horizontal) 200m X 200m
Plate thickness (vertical) 20m
Plate depth to top 150m
0.001
0.01
0.1
1
0 50 100 150 200 250 300 350 400 450 500
Depth [m]
Apparent conductivity [S/m]
Input model
SLDT: no depth factor
SLDT: depth factor 1
SLDT: depth factor 2
SLDT: depth factor 3
TEMIX 3L inversion
TEMIX 10L smooth inversion
Figure 4-22: Comparison of S-layer differential transform (SLDT) solutions using different
depth factors and layered earth inversions of synthetic data for a thin conductive plate in a
resistive half space.
The thin conductive plate is underestimated in depth and conductivity by all the methods
employed (except the SLDT no correction which still overestimates depth). The SLDT
correction factor 3 correlates best with the smooth inversion and is closer to the input
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