User Manual

2-1

SM 04L31A01-01E

Testing

Chapter 2 Testing

2.1 Overview of Tests

The following describes general testing procedures for DAQSTATION CX1000/CX2000

series instruments. For tests on specific modules or assemblies, see sections 2.3 and

later.

Operating Conditions

Ambient Temperature: 23 ± 2°C

Relative Humidity: 55 ± 20%

Test Instruments

Instrument Specifications

DC voltage generator Accuracy: 0.005% of setting + 1 mV

DMM Accuracy: 0.005% of rdg + 1 mV

Resistors Accuracy: 0.01% or better

Insulation tester 500 VDC

Withstanding voltage tester AC 1 to 3 kV, 500 VDC

External monitor (for test of /D5 option) VGA monitor (H: 33.3 kHz, V: 60.168 Hz)

Oscilloscope 200 kS/s or more, isolated input

Thermostatic chamber ZC-114 (Coper Electronics Co., Ltd.) or equivalent

Testing Conditions

The tests cover all included A/D converters.

The unit's analog input is in analog multiplexer format.

For the CX1000, channel group 1–6 of the measurement input section and channel

group 7–11 of the control input section are each assigned to one A/D converter. For the

CX2000, channel groups 1–5 and 6–10 of the control input section (slot 1) and channel

groups 1–10 and 11-20 of the measurement input section (slots 2 and 3) are each

assigned to one A/D converter.

Therefore, except for when specifying inputs linked to the same A/D converter, only one arbitrary

channel within a group need be tested (for example, not channels 1—5 but only channel 1).