User guide

PLATESCOPE

NOTE: The settings cannot be changed once the measurement sequence has started. All

patches must be deleted before settings can once again be changed. See below for patch

deletion information.

6. Locate the instrument’s target window on the 2% patch of the target strip using the reticule

icon in the screen for positioning.

For easier targeting, the exposure can be adjusted to high (4), medium high (3), medium low

(2), and low (1). Simply use the Navigation Ring to move the highlight focus to the

Illumination icon, and then press down on the bottom of the Navigation Ring to page

through the various exposure settings.

7. Press the Measure button to take the measurement. The screen displays a filled in box over

the 2% patch and the measurement data appears. Like spot measurement mode, dot angle,

dot size, and pitch (lpi) data may take some extra time to calculate (approx. 3-5 seconds).

Values that are in the process of being calculated appear as “---” until the results are

available. If a value is not available for a particular attribute, the “---” will disappear.

NOTE: Dot size, Dot angle, and Dot pitch only appear if the instrument is configured to have

these calculations enabled. These calculations can only be configured utilizing the PlateQuality

and Capture Tool applications.

NOTE: Dot percentage can be configured to either one (X.X%) or two (X.XX%) place

precision. The precision option can only be configured utilizing the PlateQuality and Capture

Tool applications.

Positioning reticule

Dot screen

Illumination

Measurement area

Delete measurement(s)

Filled in box indicates

which patch is displaying

the measurement results

Location indicator

Image

Dot percentage

Next arrow

Substrate

Exposure setting