User guide

PLATESCOPE
21
Spot Measurement Mode
The spot measurement mode is used to take measurements on an offset plate and display the
results. A graphical representation of the measured area displays in the screen and can be zoomed
on for better viewing. Refer to Zoom Mode operation later in this section.
The spot measurement screen displays the title bar at the top, measurement data in the center,
and current settings at the bottom.
Measuring a Spot
1. From the Main screen, use the Navigation Ring to move the highlight focus to the Spot
Measurement icon.
2. Press the Select button to enter spot targeting mode.
3. Position the instrument’s target window on the sample using the reticule icon in the display for
positioning. Make sure the sample is flat and the instrument is making good contact.
For easier targeting of both highlight and shadow areas, the exposure can be adjusted to high
(4), medium high (3), medium low (2), and low (1). Simply use the Navigation Ring to
move the highlight focus to the Illumination icon, and then press down on the bottom of the
Navigation Ring to page through the various exposure settings.
4. Adjust the current setting if desired. Use the Navigation Ring to move the highlight focus to
Image, Dot Screen, Substrate, or Illumination option icon.
NOTE: Changing a measurement setting will require the instrument to measure a “tonal”
patch. This measurement lets the instrument learn or adjust itself specifically to that surface
for the best accuracy. If no tonal patch is available, measure a midtone patch (something as
close to 50% as possible).
Press the Select button to page through available options (see explanation below). The option
displayed is the active option.
Image Type (+ or -)
Used to select positive (+) or negative (-) material.
Dot Screen Type (AM, FM, or Hyb)
Used to select Conventional (AM), Stochastic (FM) or Hybrid (Hyb) screening.
Positioning reticule
Dot screen
Image
Illumination
Measurement area
Spot mode icon
Tonal appearing here indicates the settings
were changed and a tonal patch must be
measured (see note below).
Substrate
Exposure setting