Datasheet

Table Of Contents
PN532_C1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.6 — 28 November 2017
115436 186 of 222
NXP Semiconductors
PN532/C1
Near Field Communication (NFC) controller
[1] Current output. The use of 1 k pull down resistor on AUX1 is recommended.
[2] Current output. The use of 1 k pull down resistor on AUX2 is recommended.
3 to 0 AnalogSelAux2[3:0] Controls the AUX2 pin. Note: All test signals are described in
Section 8.6.21.3 “
Test signals at pin AUX” on page 142.
0000 Tristate
0001 DAC output: register CIU_TestDAC2
[2]
0010 DAC output: test signal corr1
[2]
0011 DAC output: test signal corr2
[2]
0100 DAC output: test signal MinLevel
[2]
0101 DAC output: ADC_I
[2]
0110 DAC output: ADC_Q
[2]
0111 DAC output: ADC_I combined with ADC_Q
[2]
1000 Test signal for production test
1001 secure IC clock
1010 ErrorBusBit as described in Table 177 on page 145
1011 Low
1100 TxActive
At 106 kbit/s: High during Start bit, Data bits, Parity and
CRC
At 212 kbit/s and 424 kbit/s: High during Preamble, Sync,
Data bits and CRC
1101 RxActive
At 106 kbit/s: High during Data bits, Parity and CRC
At 212 kbit/s and 424 kbit/s: High during Data bits and CRC
1110 Subcarrier detected
At 106 kbit/s: not applicable
At 212 kbit/s and 424 kbit/s: High during last part of
preamble, Sync, Data bits and CRC.
1111 Test bus bit as defined by the TstBusBitSel in Table 264 on
page 181
Table 279. Description of CIU_AnalogTest bits …continued
Bit Symbol Description