Datasheet

PN532_C1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.6 — 28 November 2017
115436 184 of 222
NXP Semiconductors
PN532/C1
Near Field Communication (NFC) controller
8.6.23.51 CIU_AutoTest register (6326h)
Controls the digital self-test.
8.6.23.52 CIU_Version register (6327h)
Shows the version of the CIU.
Table 274. CIU_AutoTest register (address 6326h) bit allocation
Bit 7 6 5 4 3 2 1 0
Symbol - AmpRcv - - SelfTest[3:0]
Reset 01000000
Access R R R R R/W R/W R/W R/W
Table 275. Description of CIU_AutoTest bits
Bit Symbol Description
7 - Reserved.
6 AmpRcv Set to logic 1 the internal signal processing in the receiver chain is
performed non-linear. This increases the operating distance in
communication modes at 106 kbit/s.
Note: Due to non linearity the effects of MinLevel and CollLevel in
CIU_RxThreshold register are as well non linear.
5 to 4 - Reserved
3 to 0 SelfTest[3:0] Enables the digital Self Test. The self-test can be started by the Selftest
command in the CIU_Command register. The self-test is enabled by 1001.
Note: For default operation the self-test has to be disabled (0000).
Table 276. CIU_Version register (address 6327h) bit allocation
Bit 7 6 5 4 3 2 1 0
Symbol Product[3:0] Version[3:0]
Reset 10000000
Access RRRRRRRR
Table 277. Description of CIU_Version bits
Bit Symbol Description
7 to 4 Product Product 1000 (PN532)
3 to 0 Version Version 0000