Datasheet
Table Of Contents
- 1. General description
- 2. Features and benefits
- 3. Applications
- 4. Quick reference data
- 5. Ordering information
- 6. Block diagram
- 7. Pinning information
- 8. Functional description
- 8.1 80C51
- 8.2 General purpose IOs configurations
- 8.3 Host interfaces
- 8.4 Power management
- 8.5 Power clock and reset controller
- 8.6 Contactless Interface Unit (CIU)
- 8.6.1 Feature list
- 8.6.2 Simplified block diagram
- 8.6.3 Reader/Writer modes
- 8.6.4 ISO/IEC 18092, ECMA 340 NFCIP-1 operating mode
- 8.6.5 Card operating modes
- 8.6.6 Overall CIU block diagram
- 8.6.7 Transmitter control
- 8.6.8 RF level detector
- 8.6.9 Antenna presence self test
- 8.6.10 Random generator
- 8.6.11 Data mode detector
- 8.6.12 Serial data switch
- 8.6.13 NFC-WI/S2C interface support
- 8.6.14 Hardware support for FeliCa and NFC polling
- 8.6.15 CRC co-processor
- 8.6.16 FIFO buffer
- 8.6.17 CIU_timer
- 8.6.18 Interrupt request system
- 8.6.19 CIU Power Reduction Modes
- 8.6.20 CIU command set
- 8.6.20.1 General description
- 8.6.20.2 General behavior
- 8.6.20.3 Commands overview
- 8.6.20.4 Idle command
- 8.6.20.5 Config command
- 8.6.20.6 Generate RandomID command
- 8.6.20.7 CalcCRC command
- 8.6.20.8 Transmit command
- 8.6.20.9 NoCmdChange command
- 8.6.20.10 Receive command
- 8.6.20.11 Transceive command
- 8.6.20.12 AutoColl command
- 8.6.20.13 MFAuthent command
- 8.6.20.14 SoftReset command
- 8.6.21 CIU tests signals
- 8.6.22 CIU memory map
- 8.6.23 CIU register description
- 8.6.23.1 CIU register bit behavior
- 8.6.23.2 CIU_SIC_CLK_en register (6330h)
- 8.6.23.3 CIU_Command register (D1h or 6331h)
- 8.6.23.4 CIU_CommIEn register (D2h or 6332h)
- 8.6.23.5 CIU_DivIEn register (D3h or 6333h)
- 8.6.23.6 CIU_CommIrq register (D4h or 6334h)
- 8.6.23.7 CIU_DivIrq register (D5h or 6335h)
- 8.6.23.8 CIU_Error register (D6h or 6336h)
- 8.6.23.9 CIU_Status1 register (DFh or 6337h)
- 8.6.23.10 CIU_Status2 register (E9h or 6338h)
- 8.6.23.11 CIU_FIFOData register (EAh or 6339h)
- 8.6.23.12 CIU_FIFOLevel register (EBh or 633Ah)
- 8.6.23.13 CIU_WaterLevel register (ECh or 633Bh)
- 8.6.23.14 CIU_Control register (EDh or 633Ch)
- 8.6.23.15 CIU_BitFraming register (EEh or 633Dh)
- 8.6.23.16 CIU_Coll register (EFh or 633Eh)
- 8.6.23.17 CIU_Mode register (6301h)
- 8.6.23.18 CIU_TxMode register (6302h)
- 8.6.23.19 CIU_RxMode register (6303h)
- 8.6.23.20 CIU_TxControl register (6304h)
- 8.6.23.21 CIU_TxAuto register (6305h)
- 8.6.23.22 CIU_TxSel register (6306h)
- 8.6.23.23 CIU_RxSel register (6307h)
- 8.6.23.24 CIU_RxThreshold register (6308h)
- 8.6.23.25 CIU_Demod register (6309h)
- 8.6.23.26 CIU_FelNFC1 register (630Ah)
- 8.6.23.27 CIU_FelNFC2 register (630Bh)
- 8.6.23.28 CIU_MifNFC register (630Ch)
- 8.6.23.29 CIU_ManualRCV register (630Dh)
- 8.6.23.30 CIU_TypeB register (630Eh)
- 8.6.23.31 CIU_CRCResultMSB register (6311h)
- 8.6.23.32 CIU_CRCResultLSB register (6312h)
- 8.6.23.33 CIU_GsNOff register (6313h)
- 8.6.23.34 CIU_ModWidth register (6314h)
- 8.6.23.35 CIU_TxBitPhase register (6315h)
- 8.6.23.36 CIU_RFCfg register (6316h)
- 8.6.23.37 CIU_GsNOn register (6317h)
- 8.6.23.38 CIU_CWGsP register (6318h)
- 8.6.23.39 CIU_ModGsP register (6319h)
- 8.6.23.40 CIU_TMode register (631Ah)
- 8.6.23.41 CIU_TPrescaler register (631Bh)
- 8.6.23.42 CIU_TReload_hi register (631Ch)
- 8.6.23.43 CIU_TReloadVal_lo register (631Dh)
- 8.6.23.44 CIU_TCounterVal_hi register (631Eh)
- 8.6.23.45 Register CIU_TCounterVal_lo (631Fh)
- 8.6.23.46 CIU_TestSel1 register (6321h)
- 8.6.23.47 CIU_TestSel2 register (6322h)
- 8.6.23.48 CIU_TestPinEn register (6323h)
- 8.6.23.49 CIU_TestPinValue register (6324h)
- 8.6.23.50 CIU_TestBus register (6325h)
- 8.6.23.51 CIU_AutoTest register (6326h)
- 8.6.23.52 CIU_Version register (6327h)
- 8.6.23.53 CIU_AnalogTest register (6328h)
- 8.6.23.54 CIU_TestDAC1 register (6329h)
- 8.6.23.55 CIU_TestDAC2 register (632Ah)
- 8.6.23.56 CIU_TestADC register (632Bh)
- 8.6.23.57 CIU_RFlevelDet register (632Fh)
- 8.7 Registers map
- 9. Limiting values
- 10. Recommended operating conditions
- 11. Thermal characteristics
- 12. Characteristics
- 12.1 Power management characteristics
- 12.2 Overcurrent detection
- 12.3 Current consumption characteristics
- 12.4 Antenna presence self test thresholds
- 12.5 Typical 27.12 MHz Crystal requirements
- 12.6 Pin characteristics for 27.12 MHz XTAL Oscillator (OSCIN, OSCOUT)
- 12.7 RSTPD_N input pin characteristics
- 12.8 Input pin characteristics for I0 and I1
- 12.9 RSTOUT_N output pin characteristics
- 12.10 Input/output characteristics for pin P70_IRQ
- 12.11 Input/output pin characteristics for P30 / UART_RX, P31 / UART_TX, P32_INT0, P33_INT1
- 12.12 Input/output pin characteristics for P34 / SIC_CLK
- 12.13 Input/output pin characteristics for P35
- 12.14 Input pin characteristics for NSS / P50_SCL / HSU_RX
- 12.15 Input/output pin characteristics for MOSI / SDA / HSU_TX
- 12.16 Input/output pin characteristics for MISO / P71 and SCK / P72
- 12.17 Input pin characteristics for SIGIN
- 12.18 Output pin characteristics for SIGOUT
- 12.19 Output pin characteristics for LOADMOD
- 12.20 Input pin characteristics for RX
- 12.21 Output pin characteristics for AUX1/AUX2
- 12.22 Output pin characteristics for TX1/TX2
- 12.23 Timing for Reset and Hard-Power-Down
- 12.24 Timing for the SPI compatible interface
- 12.25 Timing for the I2C interface
- 13. Application information
- 14. Package outline
- 15. Abbreviations
- 16. Revision history
- 17. Legal information
- 18. Contact information
- 19. Contents
PN532_C1 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2017. All rights reserved.
Product data sheet
COMPANY PUBLIC
Rev. 3.6 — 28 November 2017
115436 182 of 222
NXP Semiconductors
PN532/C1
Near Field Communication (NFC) controller
8.6.23.47 CIU_TestSel2 register (6322h)
General test signal configuration and PRBS control.
8.6.23.48 CIU_TestPinEn register (6323h)
Enable the output drivers for the test pins.
Table 266. CIU_TestSel2 register (address 6322h) bit allocation
Bit 7 6 5 4 3 2 1 0
Symbol TstBusFlip PRBS9 PRBS15 TstBusSel[4:0]
Reset 0 0 0 00000
Access R/W R/W R/W R/W R/W R/W R/W R/W
Table 267. Description of CIU_TestSel2 bits
Bit Symbol Description
7 TstBusFlip If set to logic 1, the internal test bus(D6-D0) is mapped to the external
test bus pins by the following order: D4,D3, D2,D6,D5, D0, D1. See
Section 8.6.21.2 “CIU test bus” on page 141.
6 PRBS9 Starts and enables the PRBS9 sequence according ITU-TO150.
Note: All relevant register to transmit data have to be configured before
entering PRBS9 mode.
Note: The data transmission of the defined sequence is started by the
Transmit command.
5 PRBS15 Starts and enables the PRBS15 sequence according ITU-TO150.
Note: All relevant register to transmit data have to be configured before
entering PRBS15 mode.
Note: The data transmission of the defined sequence is started by the
Transmit command.
4 to 0 TstBusSel[4:0] Selects the test bus source. See Section 8.6.21.2 “
CIU test bus” on
page 141.
Table 268. CIU_TestPinEn register (address 6323h) bit allocation
Bit 7 6 5 4 3 2 1 0
Symbol TestPinEn[7:0]
Reset 00000000
Access R/W R/W R/W R/W R/W R/W R/W R/W
Table 269. Description of CIU_TestPinEn bits
Bit Symbol Description
7 to 0 TestPinEn[7:0] Each of the bit enables the output driver for an internal test pin: P70_IRQ
(MSB), RSTOUT_N, P35, P34 / SIC_CLK, P33_INT1, P32_INT0, P31 /
UART_TX, P30 / UART_RX (LSB). DataEn[7] enables P70_IRQ,
DataEn[0] enables P30 / UART_RX.
Note: The data transmission of the defined sequence is started by the
Transmit command.