Product data

UJA1167 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 2 — 18 April 2014 51 of 60
NXP Semiconductors
UJA1167
Mini high-speed CAN system basis chip with Standby/Sleep modes &
watchdog
12. Test information
12.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q100 Rev-G - Failure mechanism based stress test qualification for
integrated circuits, and is suitable for use in automotive applications.
Fig 15. Timing test circuit for CAN transceiver
Fig 16. Test circuit for measuring transceiver driver symmetry
SBC
BAT
CANL
CANH
TXD
R
L
RXD
15 pF
GND
100 pF
015aaa369
015aaa444
CANH
13
10
12
CANL
SBC
4.7 nF
30 Ω
30 Ω
TXD
RXD
GND
1
4
BAT
2
f = 250 kHz
C
SPLIT