User`s guide
Glossary-4 PerSeptive Biosystems
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Glossary
Matrix
 —Low-mass, UV-absorbing 
substance used in MALDI technology to 
enable sample ionization. Common 
matrices include sinapinic acid, 
dihydroxy benzoic acid, and 
α
-cyano 4-
hydroxy cinnamic acid. See 
Appendix C, Matrices, for more 
information.
Metastable ion analysis
 —
See MS/MS analysis.
Mirror
 —A single plate at high 
voltage. Commonly used to refer to the 
reflector in a TOF instrument.
Mirror voltage ratio
 —Ratio of 
the mirror high voltage supply to the 
acceleration high voltage supply. Mirror 
Voltage = ratio x accelerating voltage. 
MS/MS analysis
 —Selection of 
a precursor ion for fragmentation, and 
the collection of the fragment ions. 
MS/MS analysis can yield sequencing 
information for a peptide. 
By acquiring data using different mirror 
voltages, you can focus on different 
segments of the fragment population. 
After acquisition, you can piece together 
the segments to examine a composite 
PSD spectrum.
Multiply charged ions
 —See 
[M+2H]
2+ 
and
[M+3H]
3+
.
m/z
 —Mass-to-charge ratio.
Parent ion
 —See Precursor ion.
Post-Source Decay 
(PSD)
—Fragmentation of an ion 
during flight, after it leaves the ion 
source region.
Post-translational 
modification
 —Non-amino acid 
modifications made to a peptide or 
protein by chemical or enzymatic 
means. Examples include deamidation, 
acetylation, oxidation, glycosylation, 
phosphorylation, and sulfation.
Pulsed Source
—Ion source in a 
Delayed Extraction system.
Precursor ion
 —Used in PSD 
Analysis software. Original ion from 
which fragments dissociate.
Precursor Ion
Selector
 —
See Timed Ion Selector.
Product ion
 —Used in PSD 
Analysis software. Fragment ion that 
dissociates from precursor ion.
Sensitivity
 —Measure of the 
amount of sample required to generate 
an acceptable mass spectrum. Usually 
expressed in terms of strength of signal 
relative to noise.
Signal intensity
 —See Intensity.
Source
 —See Ion source.
Stitch
 —Segment of a PSD 
composite spectrum.
Tandem mass 
spectrometry
 —See MS/MS 
Analysis.










