Specifications

DP83848C , DP83848I
DP83848VYB, DP83848YB
SNLS266E –MAY 2007–REVISED MARCH 2015 www.ti.com
Table 6-27. 10Base-T Status/Control Register (10BTSCR), address 1Ah (continued)
Bit Bit Name Default Description
3 RESERVED 0, RW RESERVED: Must be zero.
2 RESERVED 1, RW RESERVED: Must be set to one.
1 HEARTBEAT_DIS 0, RW Heartbeat Disable: This bit only has influence in half-duplex 10Mb mode.
1 = Heartbeat function disabled.
0 = Heartbeat function enabled.
When the device is operating at 100Mb or configured for full duplex
operation, this bit will be ignored - the heartbeat function is disabled.
0 JABBER_DIS 0, RW Jabber Disable:
Applicable only in 10BASE-T.
1 = Jabber function disabled.
0 = Jabber function enabled.
6.6.1.2.11 CD Test and BIST Extensions Register (CDCTRL1)
This register controls test modes for the 10BASE-T Common Driver. In addition it contains extended
control and status for the packet BIST function.
Table 6-28. CD Test and BIST Extensions Register (CDCTRL1), address 0x1Bh
Bit Bit Name Default Description
15:8 BIST_ERROR_COUNT 0, RO BIST ERROR Counter:
Counts number of errored data nibbles during Packet BIST. This value
will reset when Packet BIST is restarted. The counter sticks when it
reaches its max count.
7:6 RESERVED 0, RW RESERVED: Must be zero.
5 BIST_CONT_MODE 0, RW Packet BIST Continuous Mode:
Allows continuous pseudo random data transmission without any break
in transmission. This can be used for transmit VOD testing. This is used
in conjunction with the BIST controls in the PHYCR Register (19h). For
10Mb operation, jabber function must be disabled, bit 0 of the 10BTSCR
(1Ah), JABBER_DIS = 1.
4 CDPATTEN_10 0, RW CD Pattern Enable for 10Mb:
1 = Enabled.
0 = Disabled.
3 RESERVED 0, RW RESERVED: Must be zero.
2 10MEG_PATT_GAP 0, RW Defines gap between data or NLP test sequences:
1 = 15 µs.
0 = 10 µs.
1:0 CDPATTSEL[1:0] 00, RW CD Pattern Select[1:0]:
If CDPATTEN_10 = 1:
00 = Data, EOP0 sequence.
01 = Data, EOP1 sequence.
10 = NLPs.
11 = Constant Manchester 1s (10 MHz sine wave) for harmonic distortion
testing.
66 Detailed Description Copyright © 2007–2015, Texas Instruments Incorporated
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