Datasheet

6N137, VO2601, VO2611, VO2630, VO2631, VO4661
www.vishay.com
Vishay Semiconductors
Rev. 2.0, 27-Sep-16
5
Document Number: 84732
For technical questions, contact: [e-mail]
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
Fig. 5 - Single Channel Test Circuit for t
PLH
, t
PHL
, t
r
and t
f
Fig. 6 - Dual Channel Test Circuit for t
PLH
, t
PHL
, t
r
and t
f
Fig. 7 - Single Channel Test Circuit for t
EHL
, and t
ELH
1
2
3
4
8
7
6
5
18964-2
The probe and Jig capacitances are included in C
Input I
F
Output V
O
I
F
0 mA
V
OL
1.5 V
t
PHL
t
PLH
V
OH
C = 15 pF
GND
0.1 µF
bypass
V
CC
V
OUT
V
CC
I
F
R
R
L
Inpu tI
F
monitoring
node
Output V
O
monitoring
node
L
Single channel
Pulse gen.
Z = 50 Ω
t= t = 5 ns
o
f
r
M
L
= 7.5 mA
I
F
= 3.75 mA
V
E
1
2
3
4
8
7
6
5
GND
V
CC
Pulse gen.
Z
0
= 50 Ω
t
f
= t
r
= 5 ns
Input
monitoring
node
Dual channel
Output V
monitoring
node
O
I
F
R
M
R
L
C
L
=15pF
0.1 µF
bypass
18963-5
V
CC
1
2
3
4
8
7
6
5
18975-2
The probe and Jig capacitances are included in C
Inpu tV
E
Output V
O
t
EHL
t
ELH
C = 15 pF
GND
0.1 µF
bypass
V
CC
V
OUT
V
CC
I
F
R
L
Output V
O
monitoring
node
L
Single channel
Pulse gen.
Z = 50 Ω
t= t = 5 ns
o
f
r
L
7.5 mA
Input V
monitoring node
E
3 V
1.5 V
1.5 V
V
E