Product specifications
VT8601A Apollo PLE133
Revision 1.82 October 22, 2001 -5- Product Features
Technologies, Inc.
Delivering Value
Delivering ValueDelivering Value
Delivering Value
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• DVD
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Hardware-Assisted MPEG-2 Architecture for DVD with AC-3
− Simultaneous motion compensation and front-end processing (parsing, decryption and decode)
− Supports full DVD 1.0, VCD 2.0 and CD-Karaoke
− Microsoft DirectShow 3.0 native support, backward compatible to MCI
− No additional frame buffer requirements
− Sub-picture hardware eliminates Run-Length-Decoder and Alpha Blending overhead
− Dynamic frame and field de-interlace filtering for high quality playback on VGA monitors (Bob and Weave)
− Tamper-proof software CSS implementation
− Freeze, Fast-Forward, Slow Motion, Reverse
− Pan-and-Scan support for 16:9 sequence
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• Video Processor
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On-chip Color Space Converter (CSC)
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Anti-tearing via two frame buffer based capture surfaces
− Minifier for video stream compression and filtering
− Horizontal/vertical interpolation with edge recovery
− Dual frame buffer apertures for independent memory access for graphics and video
− YUV 4:2:2/4:1:1/4:2:0 and RGB formats
− Video Module Interface (VMI) to MPEG and video decoder
− Vertical Blank Interval for Intercast™
− Overlay differing video and graphic color depths
− Minifier Video Module Interface (VMI) to MPEG and video decode
− Display two simultaneous video streams from both internal AGP and VMI
− Two scalers and Color Space Converters (CSC) for independent windows
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• Digital Flat Panel (DFP) Interface
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85 MHz Flat Panel Monitor interface supports 1024x768 panels
− Uses external TMDS transmitters for advanced panel interfaces
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• Power Management Support
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Dynamic power down of SDRAM (CKE)
− Independent clock stop controls for CPU / SDRAM, AGP, and PCI bus
− PCI and AGP bus clock run and clock generator control
− VTT suspend power plane preserves memory data
− Suspend-to-DRAM and Self-Refresh operation
− EDO self-refresh and SDRAM self-refresh power down
− 8 bytes of BIOS scratch registers
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Low-leakage I/O pads
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• Testability
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Build-in NAND-tree pin scan test capability