Technical data

Analog Integrated Circuit Device Data
18 Freescale Semiconductor
908E621
TIMING DIAGRAMS
TIMING DIAGRAMS
Figure 4. Test Circuit for Transient Test Pulses
Figure 5. Test Circuit for LIN Timing Measurements
Figure 6. LIN Timing Measurements for Normal Slew Rate
LIN, L0
10k 1nF
Transient Pulse
Generator
Note: Waveform in accordance to ISO7637 part 1, test pulses 1, 2, 3a and 3b.
R0
C0
VSUP
RXD
TXD
LIN
R0 and C0 combinations:
- 1k Ohm and 1nF
- 660 Ohm and 6.8nF
- 500 Ohm and 10nF
R0 and C0 Combinations:
• 1.0 kΩ and 1.0 nF
• 600 Ω and 6.8 nF
• 500 Ω and 10 nF
V
SUP
t
DOM-MIN
t
DOM-MAX
t
RL
TXD
LIN
RXD
t
RH
t
REC-MIN
t
REC-MAX
58.1% V
SUP
40% V
SUP
28.4% V
SUP
42.2% V
SUP
60% V
SUP
74.4% V
SUP
V
LIN