Technical data

926 Keysight InfiniiVision 2000 X-Series Oscilloscopes Programmer's Guide
Index
LIN serial search, data format, 554
LIN serial search, data length, 553
LIN serial search, frame ID, 550
LIN serial search, mode, 551
LIN source, 484
LIN standard, 485
LIN sync break, 486
LIN trigger, 487, 491
LIN trigger commands, 479
LIN triggering, 447
line glitch trigger source, 615
line number for TV trigger, 622
line terminator, 117
LINE trigger level, 603
LINE trigger source, 606
list of channel labels, 260
LISTer commands, 313
lister display, 315
lister time reference, 316
load utilization (CAN), 458
local lockout, 568
lock, 568
lock mask to signal, 395
lock, analog channel protection, 573
lockout message, 568
logic level activity, 708
long form, 794
low frequency sine with glitch demo
signal, 239
low trigger level, 597
lower threshold, 355
lower threshold voltage for
measurement, 725
lowercase characters in commands, 793
low-frequency reject filter, 604
low-level voltage, waveform
generator, 690
low-pass filter used to limit
bandwidth, 220, 272
LRN (Learn Device Setup), 131
lsbfirst, 635
M
magnitude of occurrence, 365
main sweep range, 585
main time base, 747
main time base mode, 579
making measurements, 340
MAN option for probe sense, 713, 717
manual cursor mode, 319
MARKer commands, 317
marker mode, 327
marker position, 328
marker readout, 729, 730
marker set for voltage measurement, 734,
735
marker sets start time, 728
marker time, 727
markers for delta voltage
measurement, 733
markers track measurements, 360
markers, command overview, 318
markers, mode, 319
markers, time at start, 730
markers, time at stop, 729
markers, X delta, 324
markers, X1 position, 320
markers, X1Y1 source, 321
markers, X2 position, 322
markers, X2Y2 source, 323
markers, Y delta, 329
markers, Y1 position, 327
markers, Y2 position, 328
mask, 126, 140
mask command, bus, 205
mask statistics, reset, 389
mask test commands, 377
Mask Test Event Enable Register
(MTEenable), 161
mask test event event register, 163
Mask Test Event Event Register
(:MTERegister[:EVENt]), 163, 777
mask test run mode, 396
mask test termination conditions, 396
mask test, all channels, 382
mask test, enable/disable, 394
mask, delete, 393
mask, get as binary block data, 392
mask, load from binary block data, 392
mask, lock to signal, 395
mask, recall,
420
mask, save, 434, 435
masks, bind levels, 404
master summary status bit, 143
math function, stop displaying, 158
math operations, 278
MAV (Message Available), 125, 141, 143
maximum duration, 610
maximum position, 580
maximum range for zoomed window, 586
maximum scale for zoomed window, 587
maximum vertical value measurement, 370
maximum waveform data length, 442
MEASure commands, 333
measure mask test failures, 397
measure overshoot, 353
measure period, 355
measure phase between channels, 356
measure preshoot, 357
measure start voltage, 734
measure stop voltage, 735
measure value at a specified time, 374
measure value at top of waveform, 375
measurement error, 340
measurement record, 642
measurement setup, 340, 361
measurement source, 361
measurement window, 376
measurements, AC RMS, 373
measurements, average value, 368
measurements, base value, 369
measurements, built-in, 51
measurements, clear, 343, 726
measurements, command overview, 340
measurements, DC RMS, 373
measurements, definition setup, 345
measurements, delay, 347
measurements, duty cycle, 349
measurements, fall time, 350
measurements, frequency, 351
measurements, how autoscale affects, 153
measurements, lower threshold level, 725
measurements, maximum vertical
value, 370
measurements, minimum vertical
value, 371
measurements, overshoot, 353
measurements, period, 355
measurements, phase, 356
measurements, preshoot, 357
measurements, pulse width, negative, 352
measurements, pulse width, positive, 358
measurements, rise time, 359
measurements, show, 360
measurements, snapshot all, 342
measurements, source channel, 361
measurements, start marker time, 729
measurements, stop marker time, 730
measurements, thresholds, 728
measurements, time between start and stop
markers, 727
measurements, time between trigger and
edge, 363
measurements, time between trigger and
vertical value, 365
measurements, time between trigger and
voltage level, 731
measurements, upper threshold value, 732
measurements, vertical amplitude, 367
measurements, vertical peak-to-peak, 372
measurements, voltage difference, 733
memory setup, 139, 574
menu, system, 569
message available bit, 143
message available bit clear, 125
message displayed, 143
message error, 751
message queue, 769
messages ready, 143
midpoint of thresholds, 355
minimum duration, 609
minimum vertical value measurement, 371
MISO data pattern width, 504
MISO data pattern, SPI trigger, 503
MISO data source, SPI trigger, 501
MISO data, SPI, 653
mixed-signal demo signals, 239
mixed-signal oscilloscopes, 5
mnemonics, duplicate, 797
mode, 319, 579
mode, serial decode, 451
model number, 130
models, oscilloscope, 3
modes for triggering, 598