User`s guide

KA52/53/54 CPU Module Description
1.4 Memory Tests
The failure is reported by the count bad pages test 40 at end of the script.
Issuing the SHOW MEMORY command shows which memory set caused the
failure. Bad pages were detected in memory set 0.
>>>SHOW MEMORY
16 MB RAM, SIMM Set (0A,0B,0C,0D) present
Memory Set 0: 00000000 to 00FFFFFF, 16MB, 32256 good pages, 512 bad pages
16 MB RAM, SIMM Set (1E,1F,1G,1H) present
Memory Set 1: 01000000 to 01FFFFFF, 16MB, 32768 good pages, 0 bad pages
Total of 32MB, 65024 good pages, 512 bad pages, 112 reserved pages
>>>
Test DC - Check for No Memory Present
The only purpose of this test is to check for the specific condition of no valid
memory present in the system. This occurs if no memory is present, or if
memory is present and one or more SIMMs is missing or not plugged in
correctly.
Test 31 - Size and Setup Memory CSRs
Find out how much memory is available and configure into consecutive memory
starting at address 00000000. Verify proper configuration data in the CSRs.
Test 30 - Build a Bitmap in Memory
Set up a bitmap in RAM to be used by the memory tests. Test the area before
setting up a bitmap.
This test looks for a 1 MB KB section of memory to be used for the bitmap,
busmap and reserved console area and structures to run diagnostics. The test
starts at the top of available memory and tests one section of memory at the
top of each 4 MB section of memory until a good section is found for the maps
or the bottom of memory is reached, in which case the test fails.
Test 4F - Data Pattern Tests
Verifies that each bit in the data path can be written to a one and a zero
individually. This test also checks for shorts between individual paths. The
test needs to be run once for each array of memory chips.
This test uses various fix patterns and also floating 1’s and 0’s patterns across
all 72 data bits (64 data, 8 ECC). The test always checks both even and odd
QWs of data so that all four SIMMs in a memory set are tested.
Test 4E - Masked Write Cycles with No Errors, BYTE, WORD
This test verifies masked write cycles to memory.
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