User`s guide

System Troubleshooting and Diagnostics

5.3 Power-On Self-Test (POST) and ROM-Based Diagnostic (RBD) Failures

Note

Do not confuse the countdown pattern of powerup tests with the test

number. In the following the last countdown was 58; this number

should not be reported! The test number was 31.

The countdown pattern is used to indicate progress in the power-up tests. The

actual true test number associated with a countdown value can change from

one release of the ROM code to another.

For example:

KA52-A T1.2-156, VMB 2.14

Performing normal system tests.

72..71..70..69..68..67..66..65..64..63..62..61..60..59..58..

? Test_Subtest_31_06 Loop_Subtest=05 Err_Type=FF DE_Memory_Setup_CSRs.lis

Vec=0000 Prev_Errs=0000 P1=C94AC94A P2=01000000 P3=00000002 P4=00000000

Minimum recording for this error is:

Test = 31

Subtest = 6

Loop_subtest = 5

Err_type = FF

Vec = 0.

Table 5-4 lists the hex LED display, the default action on errors, and the most likely

unit that needs replacing reading from left to right. Example, 1,4 indicates 1 is most

likely, then 4. The Default on Error column refers to the action taken by the diagnostic

executive when the test fails in the script.

Memory tests are usually treated differently; when an error occurs, the

memory tests usually try to continue and mark the bitmap. Test 40 reports

failing pages in the bitmap.

When any memory test fails, always do a SHOW MEMORY to help identify

the FRU. SHOW MEMORY will identify the FRU to a SET of SIMMs or to an

individual SIMM if possible.

If a single set of SIMMs is present, and replacing a suspected bad SIMM or set

does not ﬁx the problem, assume that the system board is bad. Always check

the seating of SIMMs before replacing. If nonvolatile data is lost after powerup

or you always get a request to select a language at powerup, the battery may

be bad.

System Troubleshooting and Diagnostics 5–43