Service manual

Table 4–6 (Cont.): <REFERENCE>(XRP) Self-Test — RBD 0
Test Function
KA64A Tests
T0027 Cache Mask Write Test
T0028 Data Parity Logic Test
T0029 Cache Disable Test
T0030 XGPR Register Test
T0031 CNAK Test
T0032 IVINTR Test
T0033 Multiple Interrupt Test
T0034 DC520 Critical Path Test
T0035 F-Chip Test
T0036 Disable F-Chip Test
T0037 F-Chip Critical Path Test
FV64A Tests
T0038 VECTL Registers Test
T0039 Verse Registers Test
T0040 Load/Store Registers Test
T0041 VIB Error Logic Test
T0042 Other VECTL Chip Logic Test
T0043 Verse and Favor Test
T0044 Load/Store Translation Buffer and CAM Test
T0045 Load/Store Cache Test
T0046 Load/Store Instruction Test
T0047 Load/Store Tag and Duplicate Tag Test
T0048 Load/Store Error Cases Test
T0049 Module Critical Path Test
<REFERENCE>(XRP) Scalar Processor 4–33