Service manual

The failing test number is derived from the upper byte (bits <31:24>) of the

longword returned. For self-test, the upper byte contains the failing test

number. If CPU/memory interaction test fails, this byte contains the failing

test number plus 49. If DWMBB test fails, bit <31> is set (making the ﬁrst

digit 8 through A), and bits <30:24> contain the failing test number. All

numbers are expressed in binary-coded decimal (BCD). See Table 4–4.

Table 4–3: XMI Base Addresses

Slot Node Base Address (BB)

1 1 2188 0000

2 2 2190 0000

3 3 2198 0000

4 4 21A0 0000

5 5 21A8 0000

6 6 21B0 0000

7 7 21B8 0000

8 8 21C0 0000

9 9 21C8 0000

10 A 21D0 0000

11 B 21D8 0000

12 C 21E0 0000

13 D 21E8 0000

14 E 21F0 0000

<REFERENCE>(XRP) Scalar Processor 4–25