User`s guide

Run test number 8 through to the end of the section that is currently in RAM memory.
PASS - This keyword
is used in conjunction with the TEST keyword to indicate the number of times a
test(s)
is performed.
Example: MIC>DI SE EHKBD TE 2 5 PA 3
Load section ENKBD from the cassette into RAM memory and execute tests 2 through 5 three times.
Example: MIC>DI TE 2 5 PA -1
Run tests 2 through 5 of the section that is currently in RAM memory and repeat forever (until interrupted
by CTRL/C or CTRL/P).
SHORTEN - This keyword is used in conjunction with the TEST keyword. If an error occurs during
testing loops from the first test specified to the test in which that error occured.
Example: MIC>DI TE 1 15 SH
Run tests 1 through 15 of the section that is currently in RAM memory. If an error occurs, shorten the loop
to execute tests 1 through the test that caused the error.
R[EPEA
T] - This command repeats a command, such as a DEPOSIT or EXAMINE. The command is
terminated by a CTRL/C or CTRL/P.
R <command>
Example: MIC>R EX RA 0
This command repeats the command to examine four bytes of data at the console memory location o.
SE[T]/CL[EAR] - The SET CLEAR command is used to enable/disable flags used in the execution of
microdiagnostics.
SE <function>
CL <function>
The following functions can be set/cleared:
HA[LT]
BE [LL1
SO[MM]
LO[OP]
SHR]
DHFAUL T1
ST[EP]* BR[EAK]
HE[R]
TR[ACE]
PA[RITY]
HALT - Halt on error. SETting this flag causes the MICMON to return to the command level after
reporting an error.
Example: MIC>SE HA
LOOP - Loop on error. SETting this flag causes the MICMON to loop on the smallest piece of test code
needed to reporduce the error.
*This flag is only used with the SET command.
B-3