User`s guide

During the self-test the word "CONVxyz" is printed on the console terminal. The "xyz" designation will
vary according to the version of the console program. Each letter and digit of this word is a series of
subtest completion flags.
One letter or digit of the word "CONVxyz" is printed between each subtest and
the last two digits are printed at the end of the test (Example 2-1). The self-test sequence is as follows:
Print
<LF><CR> "C" ; Start Self-Test (power-up)
Print "0"
; PROM CHECKSUM Test
Print "N" ; USARTs Loopback Test
Print "V"
; USARTs Dual Address Test
Print "x"
; RAM Float 1 Test
Print "yz"
; RAM March Test
NOTE
The console message and the subtests performed
may change as later versions
of the program micro-
code are released.
If an error is detected while checking the 15 V power, or during a subtest, the console microprocessor loops
on that failing subtest. The two RAM subtests have a failing subtest error message. The other subtests do
not print a failure message.
The
PROM resident self-test is as follows:
• PROM CHECKSUM Test - The PROM code is verified by calculating a checksum on the
PROM and comparing it to a known checksum stored in the last location of the PROM.
•
USAR Ts Loopback Test - The three USARTs are verified by sending out data and reading it
back via a wraparound function in the USAR Ts.
• USAR Ts Dual Address Test - The three USARTs address response is verified by writing
different data to each USART command register, then reading the data back. This ensures that
each USAR T responds only to its unique address and
no other address.
• RAM Float 1 Test - The RAM data test checks the RAM data lines, the first location of RAM
(4000 hex) is read/write tested with a pattern of ones (1) floating through a field of zeros (0).
Failing Test Printout:
Expected
XXXXXXXX
Received
XXXXXXXX
2-6