Instruction manual

SPM Fundamentals for the MultiMode
Hardware
Rev. B MultiMode SPM Instruction Manual 25
2.1.5 Probes
Probes come in a variety of sizes, shapes and materials and are chosen according to the chosen type
of imaging.
Wire Probes
STM probes usually consist of wire, cut and/or etched to produce atomically sharp tips at one end.
Usually these are made from tungsten or platinum-iridium alloy wires. A potential is established so
that electrons ow between the tip and sample. A similar type of wire probe is used for lithography.
These often consist of ordinary tungsten STM tips and/or a wire with a tiny diamond xed to its
end. Lithography tips are used for mechanically deforming sample surfaces in the form of
controlled dents and scratches. Essentially, the tip serves as a scribe or punch. It may be used to test
surfaces for microhardness, etch patterns or explore material characteristics.
Figure 2.1i Diamond Tip Mounted on Wire for Microhardness Testing and Lithography Work