Instruction manual

Rev. B MultiMode SPM Instruction Manual 335
Index
Symbols
. 218, 231
A
Adjustment Screws
maintenance
324
Aliasing
211
Amplitude
118
Atomic Force Microscope (AFM)
operator precautions
10
sample precautions
12
Average count
185
B
Bias Voltage 147
Bimorph Resonant Frequency
207
C
Calibration
standard
280
Z
299—305
Calibration Procedures
306—309
cantilever substrates
57
Cantilever Tune
115
Cantilever Tune
initial settings
111
cantilevers
57
Cantilevers. See Probe Tips
Capture Calibration
183, 289—291
Center Frequency
111
Component List
49—50
Contact AFM
detector offsets
88
principles of
39—314
Contact Force
101, 203
Contact Veeco Technical Publications
333
D
Data type
force modulation
209
Data type
99, 101, 118, 119, 231
LFM
168
Date type
232
Deflection
99
DNA
imaging with TappingMode
145
Drive amplitude
187, 208, 210, 211
Drive amplitude
111, 112
Drive frequency
187, 208
Drive frequency
111, 117, 232
with MFM
228, 229—231, 257
E
Edge Effects 211
EFM
218—224, 240—242
Electric Force Microscopy See EFM
218
Electrical Hazard
symbol
5
Engage
force modulation
209
Engage
114
Engagement
false
313—314
TappingMode
113—114
Equipment Damage
symbol
5
Error Signal Mode
118
F
False Engagement 313—314
Feedback Gains
initial settings
100
Force Cal
adjustment
195
Force Cal
99, 101, 183—197
Force Calibration
276
Capture
190
Drive amplitude
187
Drive Frequency
187
Force Curve