Instruction manual

Introduction to the Digital Instruments MultiMode SPM
Microscope Specifications
14 MultiMode SPM Installation Manual Rev. B
• Magnetic Force Microscope (MFM)—Measures magnetic force gradient distribution
above the sample surface. Performed using LiftMode to track topography (Basic
Extender Module recommended for NanoScope III or IIIA). See Chapter 13.
• Electric Force Microscope (EFM)— Measures electric field gradient distribution
above sample surfaces. Performed using LiftMode to track topography (Basic Extender
Module recommended for NanoScope III or IIIA). See Chapter 14.
• Surface Potential Microscopy—Measures differences in local surface potential across
the sample surface. Performed using LiftMode to track topography (Basic Extender
Module only for NanoScope III or IIIA). See Chapter 14.
• LiftMode—A combined, two-pass technique that separately measures topography
(using TappingMode) and another selected property (e.g., magnetic or electric force),
using the topographical information to track the probe tip at a constant height above the
surface (patented). See Chapter 12.
• Force Modulation—Measures relative elasticity/stiffness of surface features
(patented). Force modulation is only one of several types of force imaging which are
possible. See Chapter 11.
• Lateral Force Microscopy (LFM)—Measures frictional forces between the probe tip
and sample surface. See Chapter 10.
• Scanning Tunneling Microscopy (STM)—Measures topography of the sample surface
using a tunneling current which is dependent on the separation between the probe tip
and a conductive sample surface. An optional Low-Current STM Converter allows
operation in the sub-picoamp tunneling current region which can be useful when
scanning poorly conductive samples. Tunneling spectroscopy may also be performed.
See Chapter 9.
• Electrochemical Microscopy (ECSTM and ECAFM)—Measures the surface
structure and properties of conducting materials immersed in electrolyte solutions with
or without potential control. See ECSTM/ECAFM manuals.
• Lithography—Use of a probe tip to mechanically scribe or indent a sample surface.
May be used to generate patterns, test surfaces for microhardness, etc. Performed using
AFM and STM. See the Command Reference Manual and Support Note 225.
Most of these imaging techniques are discussed in this manual. If you do not find sufficient
information here, refer to Veeco web site (http://www.veeco.com) to order the necessary support
notes or obtain technical support.