Instruction manual

Electric Force (EFM) Imaging

Electric Field Gradient Detection—Preparation

244 MultiMode SPM Instruction Manual Rev. B

14.3 Electric Field Gradient Detection—Preparation

This section explains how to conduct electric ﬁeld gradient imaging by applying a voltage to the tip

or sample to generate electric ﬁelds.

Note: If the sample being imaged has a permanent electric ﬁeld which does not

require the external application of voltage, the steps below are not required and

you can proceed to Section 14.4.

Please consider the following before proceeding:

• Before attempting to reconﬁgure the jumpers, carefully read the following Jumper

Conﬁguration sections.

•A modiﬁed cantilever is required to bias the tip in EFM. Contact Veeco tech support for

more information.

When it is necessary to apply voltage to the tip or sample, minor changes must be made to the

jumpers in the microscope’s baseplate and the toggle switches on the Basic Extender Module (if

equipped). Original jumper conﬁgurations and jumper changes are dependent on the microscope

being used and the measurements desired. Section 14.3.1 provides jumper conﬁguration

instructions for basic microscope models operating without the Basic Extender Module in four

sections:

•“Voltage Applied to the Tip” on page 246

•“Voltage Applied to the Sample” on page 248

• “External Voltage Source Applied to the Tip” on page 249

• “External Voltage Source Applied to the Sample” on page 250

Section 14.3.2 provides jumper conﬁguration instructions for basic microscope models operating

with the Basic Extender Module in four sections:

•“Voltage Applied to the Tip” on page 252

•“Voltage Applied to the Sample” on page 253

• “External Voltage Source Applied to the Tip” on page 254

• “External Voltage Source Applied to the Sample” on page 255

The location and orientation of the jumpers in the baseplate of the MultiMode is shown below in

Figure 14.3a. To change the jumpers, it should not be necessary to remove the baseplate; they can

easily be changed through the rectangular opening in the bottom of the baseplate using a pair of

non-conducting tweezers. For non-EFM applications and surface potential operation, jumpers are

usually left in their original positions or returned to their original positions.