Instruction manual

Rev. B MultiMode SPM Instruction Manual 239
Chapter 14 Electric Force (EFM) Imaging
The following sections are included in this chapter:
• Electric Force Microscopy Overview: Section 14.1
• Electric Field Gradient Imaging Overview: Section 14.1.1
• Surface Potential Imaging Overview: Section 14.1.2
• Electric Field Gradient Detection—Theory: Section 14.2
• Electric Field Gradient Detection—Preparation: Section 14.3
• Jumper Configurations for systems without the Basic Extender Module:
Section 14.3.1
• Jumper Configurations for systems with the Basic Extender Module: Section
14.3.2
• Electric Field Gradient Detection—Procedures: Section 14.4
• Phase Detection: Section 14.4.1
• Amplitude Detection: Section 14.4.2
• Surface Potential Detection—Theory: Section 14.5
• Surface Potential Detection—Preparation: Section 14.6
• Applying Voltage to the Sample Directly: Section 14.6.1
• Applying Voltage to the Sample Through Piezo Cap: Section 14.6.2
• Surface Potential Imaging—Procedure: Section 14.7
• Troubleshooting the Surface Potential Feedback Loop: Section 14.7.1