Instruction manual

Rev. B MultiMode SPM Instruction Manual 225

Chapter 13 Magnetic Force (MFM)

Imaging

This chapter describes how to perform Magnetic Force Microscopy (MFM) using the Interleave

and LiftMode procedures discussed in Chapter 12. Please review those sections prior to attempting

MFM. Best results will be obtained with either the Digital Instruments Veeco Basic Extender

Module or the Quadrex Extender Module. These hardware units allows phase detection and

frequency modulation for optimal MFM imaging.

Speciﬁcally, this chapter discusses the following topics:

• Magnetic Force Imaging Theory: Section 13.1

• MFM Using Interleave Scanning and LiftMode: Section 13.2

• Procedure: Section 13.2.1

• Frequency Modulation: Section 13.2.2

• Installation of the Extender Electronics Modules: Section 13.3

• Basic Extender: Section 13.3.1

• Quadrex Extender: Section 13.3.2

• NanoScope IV: Section 13.3.3

• Software Setup Conﬁguration (Basic, Quadrex or NSIV): Section 13.4

• Troubleshooting Suggestions: Section 13.5

• MFM Image Veriﬁcation: Section 13.5.1

• Saturation in Amplitude Detection: Section 13.5.2

• Optical Interference: Section 13.5.3

• Advanced Topics: Section 13.6

• Lift Scan Height and Magnetic Imaging Resolution: Section 13.6.1

• Fine Tuning Interleave Controls: Section 13.6.2