Instruction manual

Interleave Scanning and LiftMode
Preface: Interleave Scanning & LiftMode
218 MultiMode SPM Instruction Manual Rev. B
12.1 Preface: Interleave Scanning & LiftMode
Interleave is an advanced feature of NanoScope software which allows the simultaneous
acquisition of two data types. Enabling Interleave alters the scan pattern of the piezo. After each
main scan line trace and retrace (in which topography is typically measured), a second (Interleave)
trace and retrace is made with data acquired to produce an image concurrently with the main scan.
Typical applications of interleave scanning include MFM (magnetic force microscopy) and EFM
(electric force microscopy) measurements; Chapter 13 provides detailed instructions for obtaining
MFM images of a standard magnetic sample. Enabling Interleave with the mode set to Lift enacts
LiftMode. During the interleave scan, the feedback is turned off and the tip is lifted to a user-
selected height above the surface to perform far field measurements such as MFM and EFM. By
recording the cantilever deflection or resonance shifts caused by the magnetic or electric forces on
the tip, a magnetic force or electric force image is produced; see Chapter 13 and Chapter 14.
LiftMode was developed to isolate purely MFM and EFM data from topographic data.
Interleave can also be used in Interleave mode. In this mode, the feedback is kept on while
additional topography, phase lateral force, or force modulation data is acquired.
The Interleave commands utilize a set of Interleave Controls which allow several scan controls
(Drive amplitude, Setpoint, and various gains) to be set independently of those in the main scan
controls.
This chapter provides a general discussion of the Interleave action and commands, with emphasis
on LiftMode. Chapter 13 and Chapter 14 provide step-by-step instructions for using Interleave
scanning and LiftMode for obtaining magnetic and electric force data. For purposes of learning to
use Interleave scanning, this section may be useful even to those users whose end application is not
magnetic force microscopy.