Instruction manual

Force Imaging
Force Volume
Rev. B MultiMode SPM Instruction Manual 215/(216 Blank)
Note: If the Lift scan height is too large, the interleave may be tapping, and therefore
not in the continuous contact required for force modulation.
4. Adjust the interleaved Drive amplitude and Lift scan height until the force modulation
image is optimized. This may require some experimentation.
Note: If you see a lot of contrast in the amplitude image before reaching the surface,
try reducing the Integral and Proportional gains in the Feedback Controls
panel. Adjust gains slightly lower than when performing normal TappingMode
imagery. Verify by setting a Lift scan height of 100nm, then adjusting the
gains (and possibly Drive amplitude) until you see the minimum amount of
contrast in the amplitude image. Once you minimize contrast, enter a Lift scan
height of 0.0nm and approach the surface.
11.8 Force Volume
Force volume imaging with the atomic force microscope (AFM), available with NanoScope
software versions 4.22 and higher, combines force measurement and topographic imaging
capabilities. A force volume data set can be used to map in two or three dimensions the interaction
forces between a sample and the AFM tip and correlate the force data with topographic
information. Possible applications include elasticity, adhesion, electrostatic, magnetic, and binding
studies. Advantages of force volume imaging include the ability to collect distributions of forces at
various Z-positions and at thousands of XY positions during a single image scan, correlation of
surface topography to interaction force, better quantization of the interaction force, and new
methods of analysis. For detailed information regarding force volume imaging, contact Veeco for a
copy of Support Note 240A, Force Volume.