Instruction manual

Rev. B MultiMode SPM Instruction Manual 175
Chapter 11 Force Imaging
Force plots are used to measure tip-sample interactions and determine optimal setpoints. More
recently, microscopists have begun to collect force measurements across entire surfaces to reveal
new information about the sample. This area of SPM promises to open new chapters in materials
science, biology and other investigative areas.
Specifically, this chapter details the following topics:
• Force Plots–An Analogy: Section 11.1
• Force Calibration Mode: Section 11.2
• Example Force Plot: Section 11.2.1
• Contact AFM Force Plots: Section 11.2.2
• Force Calibration Control Panels and Menus: Section 11.3
• Main Controls (Ramp Controls): Section 11.3.1
• Main Controls Panel (Display): Section 11.3.2
• Channel 1, 2, 3 Panels: Section 11.3.3
• Feedback Controls Panel: Section 11.3.4
• Scan Mode Panel (Advanced Mode Only): Section 11.3.5
• Menu Bar Commands: Section 11.3.6
• Force Calibration (Contact Mode AFM): Section 11.4
• Obtaining a Good Force Curve: Section 11.4.1
• Helpful Suggestions: Section 11.4.2
• Advanced Techniques: Section 11.4.3
• Interpreting Force Curves: Section 11.4.4