Datasheet

7-737
Specifications CD4016BMS
Schematic Diagram
FIGURE 1. 1 OF 4 IDENTICAL SECTIONS
Interim Test 3 (Post Burn-In) 100% 5004 1, 7, 9 IDD, IOL5, IOH5A
PDA (Note 1) 100% 5004 1, 7, 9, Deltas
Final Test 100% 5004 2, 3, 8A, 8B, 10, 11
Group A Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B Subgroup B-5 Sample 5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6 Sample 5005 1, 7, 9
Group D Sample 5005 1, 2, 3, 8A, 8B, 9 Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS METHOD
TEST READ AND RECORD
PRE-IRRAD POST-IRRAD PRE-IRRAD POST-IRRAD
Group E Subgroup 2 5005 1, 7, 9 Table 4 1, 9 Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION OPEN GROUND VDD 9V ± -0.5V
OSCILLATOR
50kHz 25kHz
Static Burn-In 1
Note 1
2, 3, 9, 10 1, 4-8, 11-13 14
Static Burn-In 2
Note 1
2, 3, 9, 10 7 1, 4-6, 8, 11-14
Dynamic Burn-
In Note 1
- 7 14 2, 3, 9, 10 5, 6, 12, 13 1, 4, 8, 11
Irradiation
Note 2
2, 3, 9, 10 7 1, 4-6, 8, 11-14
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V ± 0.5V
TABLE 6. APPLICABLE SUBGROUPS
(Continued)
CONFORMANCE GROUP METHOD GROUP A SUBGROUPS READ AND RECORD
VDD
VSS
IN/OUT
OUT/IN
CONTROL
VC
n
p