User Manual
MPU-6000/MPU-6050 Register Map and
Descriptions
Document Number: RM-MPU-6000A-00
Revision: 4.2
Release Date: 08/19/2013
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Obtaining the Gyroscope Factory Trim (FT) Value
If InvenSense MotionApps software is not used, the procedure detailed below should be followed to
obtain the Factory trim value of the self test response (FT) mentioned above. For the specific
registers mentioned below, please refer to registers 13-15.
The Factory trim value of the self test response (FT) is calculated as shown below. FT[Xg], FT[Yg],
and FT[Zg] refer to the factory trim (FT) values for the gyroscope X, Y, and Z axes, respectively.
XG_TEST is the decimal version of XG_TEST[4-0], YG_TEST is the decimal version of YG_TEST[4-
0], and ZG_TEST is the decimal version of ZG_TEST[4-0].
When performing self test for the gyroscope, the full-scale range should be set to ±250dps.
if XG_TEST ≠ 0
if XG_TEST = 0
if YG_TEST ≠ 0
if YG_TEST = 0
if ZG_TEST ≠ 0
if ZG_TEST = 0
2. Accelerometer Hardware Self-Test: Relative Method
Accelerometer self-test permits users to test the mechanical and electrical portions of the
accelerometer. Code for operating self-test is included within the MotionApps software provided by
InvenSense. Please refer to the next section (titled Obtaining the Accelerometer Factory Trim (FT)
Value) if not using MotionApps software.
When self-test is activated, the on-board electronics will actuate the appropriate sensor. This
actuation simulates an external force. The actuated sensor, in turn, will produce a corresponding
output signal. The output signal is used to observe the self-test response.
The self-test response (STR) is defined as follows:
This self test-response is used to determine whether the part has passed or failed self-test by finding
the change from factory trim of the self-test response as follows:
This change from factory trim of the self-test response must be within the limits provided in the MPU-
6000/MPU-6050 Product Specification document for the part to pass self-test. Otherwise, the part is
deemed to have failed self-test.