Datasheet
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.1_00
Seiko Instruments Inc.
14
(7) S-8261ABG, S-8261ABI, S-8261ABL, S-8261ABT
Table 16
Item Symbol Condition Min. Typ. Max. Unit
Test
condition
Test
circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
29 36 43 ms 9 5
Overcurrent 1 detection delay time t
lOV1
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
220 320 380
µ
s 10 5
DELAY TIME (Ta =
−
40 to
+
85°C)
*1
Overcharge detection delay time t
CU
0.7 1.2 2.0 s 9 5
Overdischarge detection delay time t
DL
20 36 61 ms 9 5
Overcurrent 1 detection delay time t
lOV1
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
150 320 540
µ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(8) S-8261ABY, S-8261ABZ, S-8261ACA
Table 17
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
0.89 1.12 1.35 ms 10 5
Load short-circuiting detection delay time t
SHORT
220 320 380
µ
s 10 5
DELAY TIME (Ta =
−
40 to
+
85°C)
*1
Overcharge detection delay time t
CU
0.7 1.2 2 s 9 5
Overdischarge detection delay time t
DL
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
0.61 1.12 1.91 ms 10 5
Load short-circuiting detection delay time t
SHORT
150 320 540
µ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.