Datasheet
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
Rev.4.1_00
S-8261 Series
Seiko Instruments Inc.
13
(5) S-8261AAV, S-8261AAY
Table 14
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
3.7 4.6 5.5 s 9 5
Overdischarge detection delay time t
DL
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
3.6 4.5 5.4 ms 10 5
Load short-circuiting detection delay time t
SHORT
450 600 720
µ
s 10 5
DELAY TIME (Ta =
−
40 to
+
85°C)
*1
Overcharge detection delay time t
CU
2.5 4.6 7.8 s 9 5
Overdischarge detection delay time t
DL
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
2.5 4.5 7.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
310 600 1020
µ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(6) S-8261ABD
Table 15
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
1.48 1.84 2.2 s 9 5
Overdischarge detection delay time t
DL
92 115 138 ms 9 5
Overcurrent 1 detection delay time t
lOV1
5.76 7.2 8.8 ms 10 5
Overcurrent 2 detection delay time t
lOV2
2.88 3.6 4.32 ms 10 5
Load short-circuiting detection delay time t
SHORT
358 488 586
µ
s 10 5
DELAY TIME (Ta =
−
40 to
+
85°C)
*1
Overcharge detection delay time t
CU
1.11 1.84 2.89 s 9 5
Overdischarge detection delay time t
DL
68.9 115 182.3 ms 9 5
Overcurrent 1 detection delay time t
lOV1
4.31 7.2 11.59 ms 10 5
Overcurrent 2 detection delay time t
lOV2
2.16 3.6 5.68 ms 10 5
Load short-circuiting detection delay time t
SHORT
268 488 770
µ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.










