Datasheet

BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
Rev.4.1_00
Seiko Instruments Inc.
12
(3) S-8261AAT
Table 12
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
 3.7 4.6 5.5 s 9 5
Overdischarge detection delay time t
DL
 29 36 43 ms 9 5
Overcurrent 1 detection delay time t
lOV1
 14 18 22 ms 10 5
Overcurrent 2 detection delay time t
lOV2
 7.2 9 11 ms 10 5
Load short-circuiting detection delay time t
SHORT
 220 320 380 µ s 10 5
DELAY TIME (Ta = − 40 to + 85°C)
*1
Overcharge detection delay time t
CU
 2.5 4.6 7.8 s 9 5
Overdischarge detection delay time t
DL
 20 36 61 ms 9 5
Overcurrent 1 detection delay time t
lOV1
 10 18 31 ms 10 5
Overcurrent 2 detection delay time t
lOV2
 5 9 15 ms 10 5
Load short-circuiting detection delay time t
SHORT
 150 320 540 µ s 10 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(4) S-8261AAU, S-8261AAX, S-8261ABA
Table 13
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
 3.7 4.6 5.5 s 9 5
Overdischarge detection delay time t
DL
 115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
 7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
 1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
 220 320 380 µ s 10 5
DELAY TIME (Ta = − 40 to + 85°C)
*1
Overcharge detection delay time t
CU
 2.5 4.6 7.8 s 9 5
Overdischarge detection delay time t
DL
 80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
 5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
 1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
 150 320 540 µ s 10 5
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.