Datasheet
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
Rev.4.1_00
S-8261 Series
Seiko Instruments Inc.
11
3. Detection Delay Time
(1) S-8261AAG, S-8261AAH, S-8261AAJ, S-8261AAL, S-8261AAM, S-8261AAN, S-8261AAO, S-8261AAP,
S-8261AAR, S-8261AAZ, S-8261ABB, S-8261ABC, S-8261ABE, S-8261ABJ, S-8261ABK, S-8261ABM,
S-8261ABN, S-8261ABO, S-8261ABP, S-8261ABR, S-8261ABS, S-8261ACB, S-8261ACC, S-8261ACE,
S-8261ACI
Table 10
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
7.2 9 11 ms 10 5
Overcurrent 2 detection delay time t
lOV2
1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
220 320 380
µ
s 10 5
DELAY TIME (Ta =
−
40 to
+
85°C)
*1
Overcharge detection delay time t
CU
0.7 1.2 2.0 s 9 5
Overdischarge detection delay time t
DL
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
5 9 15 ms 10 5
Overcurrent 2 detection delay time t
lOV2
1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
150 320 540
µ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.
(2) S-8261AAS
Table 11
Item Symbol Condition Min. Typ. Max. Unit
Test
Condition
Test
Circuit
DELAY TIME (Ta = 25°C)
Overcharge detection delay time t
CU
0.96 1.2 1.4 s 9 5
Overdischarge detection delay time t
DL
115 144 173 ms 9 5
Overcurrent 1 detection delay time t
lOV1
3.6 4.5 5.4 ms 10 5
Overcurrent 2 detection delay time t
lOV2
1.8 2.24 2.7 ms 10 5
Load short-circuiting detection delay time t
SHORT
220 320 380
µ
s 10 5
DELAY TIME (Ta =
−
40 to
+
85°C)
*1
Overcharge detection delay time t
CU
0.7 1.2 2.0 s 9 5
Overdischarge detection delay time t
DL
80 144 245 ms 9 5
Overcurrent 1 detection delay time t
lOV1
2.5 4.5 7.7 ms 10 5
Overcurrent 2 detection delay time t
lOV2
1.2 2.24 3.8 ms 10 5
Load short-circuiting detection delay time t
SHORT
150 320 540
µ
s 10 5
*1.
Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
tested in production.










