Specifications
Table Of Contents
- iXon Ultra
- SAFETY AND WARNINGS INFORMATION
- SAFETY AND WARNINGS SYMBOLS
- MANUAL HANDLING
- SHIPPING AND STORAGE PRECAUTIONS
- SECTION 1 - INTRODUCTION TO IXON ULTRA HARDWARE
- 1.1 - TECHNICAL SUPPORT
- 1.2 - DISCLAIMER
- 1.3 - TRADEMARKS AND PATENT INFORMATION
- 1.4 - COMPONENTS
- 1.4.1 - Camera description
- 1.4.2 - Camera Power Supply Unit
- 1.4.3 - SOFTWARE
- 1.5 - SPECIFICATIONS
- 1.6 - ACCESSORIES
- 1.7 - SAFETY PRECAUTIONS AND MAINTENANCE
- 1.7.1 - Care of the camera
- 1.7.2 - Regular checks
- 1.7.3 - Annual electrical safety checks
- 1.7.4 - Replacement parts
- 1.7.5 - Fuse replacement
- 1.7.6 - Working with electronics
- 1.7.7 - Condensation
- 1.7.8 - Dew Point graph
- 1.7.9 - EM Gain ageing
- 1.7.10 - Minimizing particulate contamination
- 2.1 - INSTALLING THE HARDWARE
- 2.1.1- PC requirements
- 2.2 - INSTALLING ANDOR SOLIS SOFTWARE - WINDOWS O/S(XP/VISTA/SEVEN)
- 2.3 - NEW HARDWARE WIZARD
- 2.5 - WATER PIPE CONNECTORS
- 2.6 - MOUNTING POSTS
- 2.7 - COOLING
- 2.8 - START-UP DIALOG
- 3.1 - EMCCD OPERATION
- 3.1.1 - Structure of an EMCCD
- 3.1.2 - EM Gain & Read Noise
- 3.1.3 - EM Gain ON vs EM Gain OFF
- 3.1.4 - Multiplicative Noise Factor and Photon Counting
- 3.1.5 - EM Gain dependence and stability
- 3.1.6 - RealGain: Real and Linear gain
- 3.1.7 - EM Gain Ageing: What causes it and how is it countered?
- 3.1.8 - Gain and signal restrictions
- 3.1.9 - EMCAL
- 3.2 - COOLING
- 3.2.1 - Cooling options
- 3.2.2 - Heat generated in the EMCCD
- 3.2.3 Heatsink “hot side“ temperature
- 3.2.4 - Fan settings
- 3.3 - SENSOR READOUT OPTIMIZATION
- 3.3.1 - Sensor Pre-amp options
- 3.3.2 - Variable Horizontal Readout Rate
- 3.3.3 - Variable Vertical Shift Speed
- 3.3.4 - Output amplifier selection
- 3.3.5 - Baseline Optimization
- 3.3.5.1 - Baseline Clamp
- 3.3.6 - Binning and Sub Image options
- 3.4 - ACQUISITION OPTIONS
- 3.4.1 - Capture Sequence in Frame Transfer (FT) Mode
- 3.4.1.1 - Points to consider when using FT Mode
- 3.4.2 - Capture Sequence in Non-Frame Transfer Mode (NFT) with an FT EMCCD
- 3.4.2.1 - Points to note about using an FT EMCCD as a standard EMCCD
- 3.4.3 - Capture Sequence for Fast Kinetics (FK) with an FT EMCCD
- 3.4.3.1 - Points to consider when using Fast Kinetics mode
- 3.4.4 - Keep Clean Cycles
- 3.5 - TRIGGERING OPTIONS
- 3.5.1 - Triggering options in Frame Transfer (FT) mode
- 3.5.1.1 - Internal Triggering (FT)
- 3.5.1.2 - External Triggering (FT)
- 3.5.1.3 - External Exposure (FT)
- 3.5.2 - Triggering options in Non-Frame Transfer (NFT) mode
- 3.5.2.1 - Internal (NFT)
- 3.5.2.2 - External & Fast External (NFT)
- 3.5.2.3 - External Exposure (NFT)
- 3.5.2.4 - Software trigger (NFT)
- 3.5.3 - Trigger options in Fast Kinetics (FK) mode
- 3.5.3.1 - Internal (FK)
- 3.5.3.2 - External (FK)
- 3.5.3.3 - External Start (FK)
- 3.6 - SHUTTERING
- 3.7 - COUNT CONVERT
- 3.8 - OPTACQUIRE
- 3.8.1 - OptAcquire modes
- 3.9 - PUSHING FRAME RATES WITH CROPPED SENSOR MODE
- 3.9.1 - Cropped Sensor Mode Frame Rates
- 3.10 - ADVANCED PHOTON COUNTING IN EMCCDs
- 3.10.1 - Photon Counting by Post-Process
- 3.11 - SPURIOUS NOISE FILTER
- 4.1 - EMCCD TECHNOLOGY
- 4.1.1 - What is an Electron Multiplying CCD?
- 4.1.2 - Does EMCCD technology eliminate Read Out Noise?
- 4.1.3 - How sensitive are EMCCDs?
- 4.1.4 - What applications are EMCCDs suitable for?
- 4.1.5 - What is Andor Technology's experience with EMCCDs?
- 4.2 - EMCCD SENSOR
- 4.3 - VACUUM HOUSING
- 4.3.1 - Thermoelectric cooler
- 4.4 – USB 2.0 INTERFACE
- 4.5 - OUTGASSING
- 4.6 - EXTERNAL I/O
- 4.7 - SIGNAL DIAGRAMS
- 4.8 - CAMERALINK
- SECTION 5: TROUBLESHOOTING
- 5.1 - UNIT DOES NOT SWITCH ON
- 5.2 - SUPPORT DEVICE NOT RECOGNISED WHEN PLUGGED INTO PC
- 5.3 - TEMPERATURE TRIP ALARM SOUNDS (CONTINUOUS TONE)
- 5.4 - CAMERA HIGH FIFO FILL ALARM
- 5.5 - USE OF MULTIPLE HIGH SPEED USB 2.0 I/O ON ONE CAMERA
- A.1 - GLOSSARY
- A.1.1 - Readout sequence of an EMCCD
- A.1.2 - Accumulation
- A.1.3 - Acquisition
- A.1.4 - A/D Conversion
- A.1.5 - Background
- A.1.6 - Binning
- A.1.7 - Counts
- A.1.8 - Dark Signal
- A.1.9 - Detection Limit
- A.1.10 - Exposure Time
- A.1.11 - Frame Transfer
- A.1.12 - NOISE
- A.1.12.1 - Pixel Noise
- A.1.12.1.1 - Readout Noise
- A.1.12.1.2 - Shot Noise
- A.1.12.1.2.A - Shot Noise from the Signal
- A.1.12.1.2.B - Shot Noise from the Dark Signal
- A.1.12.1.3 - Calculation of Total Pixel Noise
- A.1.12.2 - Fixed Pattern Noise
- A.1.13 - Quantum Efficiency/Spectral Response
- A.1.14 - Readout
- A.1.15 - Saturation
- A.1.16 - Scans (Keep Clean and Acquired)
- A.1.17 - Shift Register
- A.1.18 - Signal To Noise Ratio
- B - MECHANICAL DIMENSIONS
- C - DECLARATION OF CONFORMITY
- D - HARDWARE AND SOFTWARE WARRANTY SERVICE
- D.1 - SERVICE DESCRIPTION
- D.2 - Access to Service
- D.3 - Hardware Remediation
- D.4 - Software Remediation
- E - THE WASTE ELECTRONIC AND ELECTRICAL EQUIPMENT REGULATIONS 2006 (WEEE)

Version 1.1 rev Jan 2013
Page 81
iXon Ultra
, Features and Functionality
3.9 - PUSHING FRAME RATES WITH CROPPED SENSOR MODE
The iXon Ultra offers Cropped Sensor Mode, which provides the following advantages:
• Specializedreadoutmodeforachievingveryfastframerates(sub-millisecondexposures)from‘standard’
cameras
• Continuousrapidspoolingofimages/spectratoharddisk
• Userselectablecroppedsensorsize–highlyintuitivesoftwaredenition
• TheiXonUltraisnowavailablewiththecomplementaryOptoMaskaccessory,whichcanbeusedtoshieldthe
region of the sensor outside of the cropped area
If an experiment demands fast temporal resolution but cannot be constrained by the maximum storage size of the
sensor (as is the case for ‘Fast Kinetics Mode’ of readout), then it is possible to readout the iXon Ultra in ‘Cropped
Sensor Mode’. In this mode, the user denes a ‘sub-array’ size from within the full image sensor area, such that it
encompasses the region of the image where change is rapidly occurring (e.g. a ‘calcium spark’ within a cell). The sensor
subsequently “imagines” that it is of this smaller dened array size, achieved through software executing special readout
patterns, and reads out at a proportionally faster frame rate. The smaller the dened array size, the faster the frame rate
achievable.
In order to use Cropped Sensor mode, one has to ensure that no light is falling on the light sensitive area outside of the
dened region. Any light collected outside the cropped area could corrupt the images which were acquired in this mode.
For microscopy set-ups this is now aided with an accessory called OptoMask, which is available from Andor.
Cropped Sensor Mode has the end result of achieving a much faster frame rate than that obtainable in a conventional
‘sub-array’ / ROI readout (during which we would still have to vertically shift the unwanted rows). The frame rate increase
is achieved by not reading out (i.e. discarding) the unwanted pixels.
Figure 36: Cropped Sensor Mode.
The active imaging area of the sensor is dened in such a way that only a small section of the entire chip is used for
imaging. The remaining area has to be optically masked to prevent light leakage and charge spill-over that would
compromise the signal from the imaging area. By cropping the sensor one achieves faster frame rates because the
temporal resolution will be set by the time it requires to read out the small section of the sensor.










