Specifications
Table Of Contents
- iXon Ultra
- SAFETY AND WARNINGS INFORMATION
- SAFETY AND WARNINGS SYMBOLS
- MANUAL HANDLING
- SHIPPING AND STORAGE PRECAUTIONS
- SECTION 1 - INTRODUCTION TO IXON ULTRA HARDWARE
- 1.1 - TECHNICAL SUPPORT
- 1.2 - DISCLAIMER
- 1.3 - TRADEMARKS AND PATENT INFORMATION
- 1.4 - COMPONENTS
- 1.4.1 - Camera description
- 1.4.2 - Camera Power Supply Unit
- 1.4.3 - SOFTWARE
- 1.5 - SPECIFICATIONS
- 1.6 - ACCESSORIES
- 1.7 - SAFETY PRECAUTIONS AND MAINTENANCE
- 1.7.1 - Care of the camera
- 1.7.2 - Regular checks
- 1.7.3 - Annual electrical safety checks
- 1.7.4 - Replacement parts
- 1.7.5 - Fuse replacement
- 1.7.6 - Working with electronics
- 1.7.7 - Condensation
- 1.7.8 - Dew Point graph
- 1.7.9 - EM Gain ageing
- 1.7.10 - Minimizing particulate contamination
- 2.1 - INSTALLING THE HARDWARE
- 2.1.1- PC requirements
- 2.2 - INSTALLING ANDOR SOLIS SOFTWARE - WINDOWS O/S(XP/VISTA/SEVEN)
- 2.3 - NEW HARDWARE WIZARD
- 2.5 - WATER PIPE CONNECTORS
- 2.6 - MOUNTING POSTS
- 2.7 - COOLING
- 2.8 - START-UP DIALOG
- 3.1 - EMCCD OPERATION
- 3.1.1 - Structure of an EMCCD
- 3.1.2 - EM Gain & Read Noise
- 3.1.3 - EM Gain ON vs EM Gain OFF
- 3.1.4 - Multiplicative Noise Factor and Photon Counting
- 3.1.5 - EM Gain dependence and stability
- 3.1.6 - RealGain: Real and Linear gain
- 3.1.7 - EM Gain Ageing: What causes it and how is it countered?
- 3.1.8 - Gain and signal restrictions
- 3.1.9 - EMCAL
- 3.2 - COOLING
- 3.2.1 - Cooling options
- 3.2.2 - Heat generated in the EMCCD
- 3.2.3 Heatsink “hot side“ temperature
- 3.2.4 - Fan settings
- 3.3 - SENSOR READOUT OPTIMIZATION
- 3.3.1 - Sensor Pre-amp options
- 3.3.2 - Variable Horizontal Readout Rate
- 3.3.3 - Variable Vertical Shift Speed
- 3.3.4 - Output amplifier selection
- 3.3.5 - Baseline Optimization
- 3.3.5.1 - Baseline Clamp
- 3.3.6 - Binning and Sub Image options
- 3.4 - ACQUISITION OPTIONS
- 3.4.1 - Capture Sequence in Frame Transfer (FT) Mode
- 3.4.1.1 - Points to consider when using FT Mode
- 3.4.2 - Capture Sequence in Non-Frame Transfer Mode (NFT) with an FT EMCCD
- 3.4.2.1 - Points to note about using an FT EMCCD as a standard EMCCD
- 3.4.3 - Capture Sequence for Fast Kinetics (FK) with an FT EMCCD
- 3.4.3.1 - Points to consider when using Fast Kinetics mode
- 3.4.4 - Keep Clean Cycles
- 3.5 - TRIGGERING OPTIONS
- 3.5.1 - Triggering options in Frame Transfer (FT) mode
- 3.5.1.1 - Internal Triggering (FT)
- 3.5.1.2 - External Triggering (FT)
- 3.5.1.3 - External Exposure (FT)
- 3.5.2 - Triggering options in Non-Frame Transfer (NFT) mode
- 3.5.2.1 - Internal (NFT)
- 3.5.2.2 - External & Fast External (NFT)
- 3.5.2.3 - External Exposure (NFT)
- 3.5.2.4 - Software trigger (NFT)
- 3.5.3 - Trigger options in Fast Kinetics (FK) mode
- 3.5.3.1 - Internal (FK)
- 3.5.3.2 - External (FK)
- 3.5.3.3 - External Start (FK)
- 3.6 - SHUTTERING
- 3.7 - COUNT CONVERT
- 3.8 - OPTACQUIRE
- 3.8.1 - OptAcquire modes
- 3.9 - PUSHING FRAME RATES WITH CROPPED SENSOR MODE
- 3.9.1 - Cropped Sensor Mode Frame Rates
- 3.10 - ADVANCED PHOTON COUNTING IN EMCCDs
- 3.10.1 - Photon Counting by Post-Process
- 3.11 - SPURIOUS NOISE FILTER
- 4.1 - EMCCD TECHNOLOGY
- 4.1.1 - What is an Electron Multiplying CCD?
- 4.1.2 - Does EMCCD technology eliminate Read Out Noise?
- 4.1.3 - How sensitive are EMCCDs?
- 4.1.4 - What applications are EMCCDs suitable for?
- 4.1.5 - What is Andor Technology's experience with EMCCDs?
- 4.2 - EMCCD SENSOR
- 4.3 - VACUUM HOUSING
- 4.3.1 - Thermoelectric cooler
- 4.4 – USB 2.0 INTERFACE
- 4.5 - OUTGASSING
- 4.6 - EXTERNAL I/O
- 4.7 - SIGNAL DIAGRAMS
- 4.8 - CAMERALINK
- SECTION 5: TROUBLESHOOTING
- 5.1 - UNIT DOES NOT SWITCH ON
- 5.2 - SUPPORT DEVICE NOT RECOGNISED WHEN PLUGGED INTO PC
- 5.3 - TEMPERATURE TRIP ALARM SOUNDS (CONTINUOUS TONE)
- 5.4 - CAMERA HIGH FIFO FILL ALARM
- 5.5 - USE OF MULTIPLE HIGH SPEED USB 2.0 I/O ON ONE CAMERA
- A.1 - GLOSSARY
- A.1.1 - Readout sequence of an EMCCD
- A.1.2 - Accumulation
- A.1.3 - Acquisition
- A.1.4 - A/D Conversion
- A.1.5 - Background
- A.1.6 - Binning
- A.1.7 - Counts
- A.1.8 - Dark Signal
- A.1.9 - Detection Limit
- A.1.10 - Exposure Time
- A.1.11 - Frame Transfer
- A.1.12 - NOISE
- A.1.12.1 - Pixel Noise
- A.1.12.1.1 - Readout Noise
- A.1.12.1.2 - Shot Noise
- A.1.12.1.2.A - Shot Noise from the Signal
- A.1.12.1.2.B - Shot Noise from the Dark Signal
- A.1.12.1.3 - Calculation of Total Pixel Noise
- A.1.12.2 - Fixed Pattern Noise
- A.1.13 - Quantum Efficiency/Spectral Response
- A.1.14 - Readout
- A.1.15 - Saturation
- A.1.16 - Scans (Keep Clean and Acquired)
- A.1.17 - Shift Register
- A.1.18 - Signal To Noise Ratio
- B - MECHANICAL DIMENSIONS
- C - DECLARATION OF CONFORMITY
- D - HARDWARE AND SOFTWARE WARRANTY SERVICE
- D.1 - SERVICE DESCRIPTION
- D.2 - Access to Service
- D.3 - Hardware Remediation
- D.4 - Software Remediation
- E - THE WASTE ELECTRONIC AND ELECTRICAL EQUIPMENT REGULATIONS 2006 (WEEE)

Version 1.1 rev Jan 2013
Page 102
iXon Ultra
Appendix
A.1.12.1.3 - Calculation of Total Pixel Noise
The total pixel noise is not simply the sum of the three main noise components (readout noise, shot noise from the dark
signal and shot noise from the signal). Rather, the rms gives a reasonable approximation - thus:
total = sqrt (readnoise² + darkshot² + sigshot²)
where:
•totalisthepixelnoise
•readnoise is the readout noise
•darkshotistheshotnoiseofthedarksignal
•sigshotistheshotnoiseofthesignal
A.1.12.2 - Fixed Pattern Noise
Fixed Pattern Noise (FPN) consists of the differences in count values read out from individual pixels, even if no light is
falling on the detector. These differences remain constant from read to read. The differences are due in part to a variation
in the dark signal produced by each pixel, and in part to small irregularities that arise during the fabrication of the
EMCCD and in part to settling time of the electronics. Since xed pattern noise is partly due to dark signal, it will change
if the temperature changes but, because it is xed, it can be completely removed from a measurement by background
subtraction.
A.1.13 - Quantum Efciency/Spectral Response
The glossary refers to signals as a number of electrons. Strictly speaking, these are “photoelectrons” created when
a photon is absorbed. When a UV or visible photon is absorbed by the detector it can, at best, produce only one
photoelectron. Photons of different wavelengths have different probabilities of producing a photoelectron, and this
probability is usually expressed as Quantum Efciency (QE) or Spectral Response.
QE is a percentage measure of the probability of a single photon producing a photoelectron, while spectral response is
the number of electrons that will be produced per unit photon energy. Many factors contribute to the QE of a EMCCD,
but the most signicant factor is the absorption coefcient of the silicon that serves as the bulk material of the device.
A.1.14 - Readout
Readout is the process by which data are taken from the pixels of the EMCCD and stored in computer memory. The
pixels, which are arranged in a single row, are read out individually in sequence. Readout involves amplifying the charge
on each pixel into a voltage, performing an analog to digital conversion and then storing the data in computer memory.
The time taken to perform this operation is known as the “read time”.
A.1.15 - Saturation
Saturation is the largest signal the EMCCD can measure. A signal is measured in terms of the amount of charge that has
built up in the individual pixels on the EMCCD-chip. A number of factors determine the maximum amount of charge that
the EMCCD can handle.










