Programming instructions

Intermec Fingerprint v7.61 – Programmer’s Reference Manual Ed. 7104
Chapter 2 Program Instructions
FUNCTEST
Field of Application Statement for performing various hardware tests.
Syntax FUNCTEST<sexp>,<svar>
<sexp> is the type of test to be performed:
"CARD" Test of memory card.
"HEAD" Test of the thermal printhead.
"KERNEL" Test of the live kernel in RAM.
ROMn Test of ROM where n is a digit denoting the number of
the SIMM socket.
<svar> is the variable in which the result will be placed.
Remarks
Each of the FUNCTEST hardware tests has a number of possible
responses:
<sexp> = "CARD"
If RAM-type memory card:
RAM OK Test was successful
FAIL,x An error was detected.
(x is the hexadecimal address of the fi rst
faulty memory byte).
If ROM-type memory card:
"NO CARD" Card is not recognized.
<sexp> = "HEAD"
HEAD OK, SIZE:n DOTS The test was successful.
n is the number of dots on the printhead.
HEAD LIFTED Printhead is lifted and must be lowered
before test can be performed.
FAULTY PRINTHEAD One or more dots on the printhead are
not working.
Note that the 24V voltage for the printhead
is not checked. Use the HEAD function
for additional printhead tests.
<sexp> = "KERNEL"
xxxxxxxx xxxxxxxx is an 8-digit hex checksum.
ERROR IN KERNEL CRC The kernel checksum differs from the
on in the header.
KERNEL BADLY CORRUPTED The kernel is corrupted.
CANNOT FIND KERNEL The kernel header cannot be found.
ERROR <nexp> IN KERNEL The error number (<nexp>) is returned.
<sexp> = "ROMn"
xxxx xxxx is a 4-digit hexadecimal checksum.
NO ROM An illegal SIMM socket was specifi ed or
no ROM is found in the socket.