Data Sheet

SMART Feature Set
Transcend IDE SSD supports the SMART command set and define some vendor-specific data to report spare/bad block
numbers in each memory management unit. Individual SMART commands are identified by the value placed in the
Feature register. Table shows these Feature register values.
SMART Feature Register Values
D0h Read Data D5h Reserved
D1h Read Attribute Threshold D6h Reserved
D2h Enable/Disable Autosave D8h Enable SMART Operations
D3h Save Attribute Values D9h Disable SMART Operations
D4h Execute OFF-LINE Immediate DAh Return Status
SMART DISABLE OPERATIONS
B0h with a Feature register value of D9h.Disables the SMART function. Upon receiving the command, the drive
disables all SMART operations. This setting is maintained when the power is turned off and then back on.
Once this command has been received, all SMART commands other than SMART ENABLE OPERATIONS are
aborted with the Aborted Command error.
This command disables all SMART capabilities including any and all timer and event count functions related
exclusively to this feature. After command acceptance, this controller will disable all SMART operations. SMART data in no
longer be monitored or saved. The state of SMART is preserved across power cycles.
SMART ENABLE/DISABLE ATTRIBUTE AUTOSAVE
B0h with a Feature register value of D2h.Enables or disables the attribute value autosave function. This command
specifies whether the current attribute values are automatically saved to the drive when it changes the mode. This setting
is maintained when the power is turned on and off.
SMART ENABL OPERATIONS
B0h with a Feature register value of D8h.Enables the SMART function. This setting is maintained when the power is
turned off and then back on. Once the SMART function is enabled, subsequent SMART ENABLE OPERATIONS
commands do not affect any parameters
SMART EXECUTE OFF-LINE IMMEDIATE
B0h with the content of the Features register equal to D4h. This command causes the device to immediately initiate
the optional set of activities that collect SMART data in an off-line mode and then save this data to the device's non-volatile
memory, or execute a self-diagnostic test routine in either captive or off-line mode.