Datasheet

T
T
T
S
S
S
3
3
3
2
2
2
G
G
G
S
S
S
S
S
S
D
D
D
2
2
2
5
5
5
S
S
S
-
-
-
M
M
M
T
T
T
S
S
S
6
6
6
4
4
4
G
G
G
S
S
S
S
S
S
D
D
D
2
2
2
5
5
5
S
S
S
-
-
-
M
M
M
T
T
T
S
S
S
1
1
1
2
2
2
8
8
8
G
G
G
S
S
S
S
S
S
D
D
D
2
2
2
5
5
5
S
S
S
-
-
-
M
M
M
T
T
T
S
S
S
2
2
2
5
5
5
6
6
6
G
G
G
S
S
S
S
S
S
D
D
D
2
2
2
5
5
5
S
S
S
-
-
-
M
M
M
T
T
T
S
S
S
5
5
5
1
1
1
2
2
2
G
G
G
S
S
S
S
S
S
D
D
D
2
2
2
5
5
5
S
S
S
-
-
-
M
M
M
2.5” Solid State Disk
Transcend Information Inc.
V0.1
Reliability
Reliability Reliability
Reliability
Wear-Leveling algorithm
The controller supports static/dynamic wear leveling. When the host writes data, the controller will find and use the block
with the lowest erase count among the free blocks. This is known as dynamic wear leveling. When the free blocks' erase
count is higher than the data blocks', it will activate the static wear leveling, replacing the not so frequently used user
blocks with the high erase count free blocks.
ECC algorithm
The controller uses BCH16/BCH24 ECC algorithm per 1024 bytes. BCH16/BCH24 can correct up to 16 or 24 random
error bits within 1024 data bytes.
Bad-block management
When the flash encounters ECC failed, program fail or erase fail, the controller will mark the block as bad block to prevent
the used of this block and caused data lost later on.