Datasheet

6N137
2007-10-01
5
Test Circuit 1.
･ C
L
is approximately 15pF which includes probe and stray wiring capacitance.
Test Circuit 2.
･ C
L
is approximately 15pF which includes prove and stray wiring capacitance.
Test Circuit 3.
Transient immunity and typical waveforms
V
OL
350mV
(
I
F
= 7.5mA
)
Monitoring
175mV
(
I
F
= 3.75mA
)
V
OH
7
6
5
1
2
3
4
8
5V
C
L
By-
pass
V
CC
47Ω
I
F
Pulse
generator
Z
O
= 50Ω
t
r
= 5ns
Node
R
L
Output
V
O
monitor-
ing
node
0.1μF
GND
1.5V
Output V
O
Input
t
pHL
and t
pLH
t
pHL
t
pLH
V
OL
V
OH
7.5mA
I
F
dc
Pulse
generator
Z
O
= 50Ω
t
r
= 5ns
C
L
By-
pass
R
L
Output
monitor-
ing
node
0.1μF
V
O
7
6
5
1
2
3
4
8
5V
V
CC
GND
Input V
E
Monitoring node
3.0V
1.5V
1.5V
Output V
O
Input V
E
t
EHL
and t
ELH
t
EHL
t
ELH
V
OL
V
O
Switching at B : I
F
= 5mA
5V
V
O
0V
t
f
10%
t
r
Switch at A : I
F
= 0mA
90%
90%
10%
10V
5V
V
O
7
6
5
1
2
3
4
8
By-
pass
V
CC
R
L
0.1μF
GND
Pulse gen.
Z
O
= 50Ω.
V
CM
A
V
FF
I
F
B