Datasheet
50mV/div
20 s/divm
500W
ExternalFET
NoFilter
500W
C
F
10nF
ExternalFET
LoadCapacitor
50mV/div
20 s/divm
XTR111
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SBOS375C –NOVEMBER 2006– REVISED JUNE 2011
DYNAMIC PERFORMANCE The output glitch magnitude depends on the
mismatch of the internal current sources. It is
The rise time of the output current is dominated by
approximately proportional to the output current level
the gate capacitance of the external FET.
and scales directly with the load resistor value. It will
differ slightly from part to part. The effects of filtering
The accuracy of the current mirror relies on the
the output are shown in Figure 40 and Figure 41.
dynamic matching of multiple individual current
sources. Settling to full resolution may require a
complete cycle lasting around 100μs. Figure 39
shows an example of the ripple generated from the
individual current source values that average to the
specified accuracy over the full cycle.
Figure 39. Output Noise without Filter into 500Ω
Figure 40. Output with 10nF Parallel to 500Ω
Copyright © 2006–2011, Texas Instruments Incorporated 15