Datasheet

VSP2582
Not Recommended for New Designs
VSP2582
www.ti.com
SBES002B JUNE 2008REVISED JUNE 2011
CCD ANALOG FRONT-END FOR DIGITAL CAMERAS
Check for Samples: VSP2582
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FEATURES
DESCRIPTION
The VSP2582 is a complete mixed-signal processing
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CCD Signal Processing:
IC for digital cameras that provides correlated double
36-MHz Correlated Double Sampling (CDS)
sampling (CDS) and analog-to-digital conversion
12-Bit Analog-to-Digital Conversion:
(ADC) for the output of charge-coupled device (CCD)
array. The CDS extracts video information of the
36-MHz Conversion Rate
pixels from the CCD signal, and the ADC converts it
No Missing Codes Ensured
to a digital signal. For varying illumination conditions,
78-dB Input-referred SNR (at CDS Gain 0 dB)
–9 dB to +35 dB very stable gain control is provided.
This gain control is linear in dB. Input signal clamping
Programmable Black Level Clamping
and offset correction of the input CDS are also
Programmable Gain Amp (PGA):
provided.
–9 dB to +35 dB, –3 dB to +9 dB
Offset correction is performed by an Optical Black
by Analog Front Gain (CDS)
(OB) level calibration loop, and held at a calibrated
–6 dB to +26 dB by Digital Gain
black level clamping for an accurate black level
Portable Operation:
reference. Additionally, the black level is quickly
Low Voltage: 2.7 V to 3.6 V
recovered after a gain change.
Low Power: 85 mW at 3.0 V and 36 MHz,
The VSP2582 is available in a QFN-36 package, and
1 mW in Standby Mode
operates from a single +3 V supply. The RHH
QFN-36 Package
package features an exposed thermal pad, resulting
in substantially improved thermal performance.
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Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2008–2011, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.

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