Datasheet

UCD3138
SLUSAP2F –MARCH 2012 –REVISED NOVEMBER 2013 www.ti.com
3.4 ELECTRICAL CHARACTERISTICS
V33A = V33D = V33DIO = 3.3V; 1μF from BP18 to DGND, T
J
= –40°C to 125°C (unless otherwise noted)
PARAMETER TEST CONDITION MIN TYP MAX UNIT
SUPPLY CURRENT
Measured on V33A. The device is
I33A powered up but all ADC12 and EADC 6.3 mA
sampling is disabled
All GPIO and communication pins are
I33DIO 0.35 mA
open
I33D ROM program execution 60 mA
I33D Flash programming in ROM mode 70 mA
The device is in ROM mode with all
I33 DPWMs enabled and switching at 2 100 mA
MHz. The DPWMs are all unloaded.
ERROR ADC INPUTS EAP, EAN
EAP – AGND –0.15 1.998 V
EAP – EAN –0.256 1.848 V
Typical error range AFE = 0 –256 248 mV
AFE = 3 0.8 1 1.20 mV
AFE = 2 1.7 2 2.30 mV
EAP – EAN Error voltage digital resolution
AFE = 1 3.55 4 4.45 mV
AFE = 0 6.90 8 9.10 mV
R
EA
Input impedance (See Figure 4-1) AGND reference 0.5 MΩ
I
OFFSET
Input offset current (See Figure 4-1) –5 5 μA
Input voltage = 0 V at AFE = 0 –2 2 LSB
Input voltage = 0 V at AFE = 1 –2.5 2.5 LSB
EADC Offset
Input voltage = 0 V at AFE = 2 –3 -3 LSB
Input voltage = 0 V at AFE = 3 –4 4 LSB
Sample Rate 16 MHz
Analog Front End Amplifier Bandwidth 100 MHz
Gain See Figure 4-2 1 V/V
A
0
Minimum output voltage 100 mV
EADC DAC
DAC range 0 1.6 V
VREF DAC reference resolution 10 bit, No dithering enabled 1.56 mV
VREF DAC reference resolution With 4 bit dithering enabled 97.6 μV
INL –3.0 3.0 LSB
DNL Does not include MSB transition –2.1 1.6 LSB
DNL at MSB transition -1.4 LSB
DAC reference voltage 1.58 1.61 V
τ Settling Time From 10% to 90% 250 ns
ADC12
I
BIAS
Bias current for PMBus address pins 9.5 10.5 μA
Measurement range for voltage monitoring 0 2.5 V
Internal ADC reference voltage –40°C to 125°C 2.475 2.500 2.525 V
–40°C to 25°C –0.4
Change in Internal ADC reference from
25°C to 85°C –1.8 mV
25°C reference voltage
(1)
25°C to 125°C –4.2
(1) As designed and characterized. Not 100% tested in production.
16 Electrical Specifications Copyright © 2012–2013, Texas Instruments Incorporated
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