Datasheet

UCC27518
UCC27519
www.ti.com SLUSB33 –MAY 2012
ABSOLUTE MAXIMUM RATINGS
(1)(2)(3)
over operating free-air temperature range (unless otherwise noted)
MIN MAX UNIT
Supply voltage range VDD -0.3 20
V
OUT voltage -0.3 VDD + 0.3
Output continuous current I
OUT_DC
(source/sink) 0.3 A
Output pulsed current (0.5 µs) I
OUT_pulsed
(source/sink) 4
IN+, IN-
(4)
, EN -0.3 20
Human Body Model, HBM 2000
V
ESD
Charged Device Model, CDM SOT-
500
23
Operating virtual junction temperature range, T
J
-40 150
Storage temperature range, T
STG
-65 150
°C
Soldering, 10 sec. 300
Lead temperature
Reflow 260
(1) Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltages are with respect to GND unless otherwise noted. Currents are positive into, negative out of the specified terminal. See
Packaging Section of the datasheet for thermal limitations and considerations of packages.
(3) These devices are sensitive to electrostatic discharge; follow proper device handling procedures.
(4) Maximum voltage on input pins is not restricted by the voltage on the VDD pin.
THERMAL INFORMATION
UCC27518 UCC27519
THERMAL METRIC SOT-23 DBV SOT-23 DBV
(1)
UNITS
5 PINS 5 PINS
θ
JA
Junction-to-ambient thermal resistance
(2)
217.6 217.6
θ
JCtop
Junction-to-case (top) thermal resistance
(3)
85.8 85.8
θ
JB
Junction-to-board thermal resistance
(4)
44.0 44.0 °C/W
ψ
JT
Junction-to-top characterization parameter
(5)
4.0 4.0
ψ
JB
Junction-to-board characterization parameter
(6)
43.2 43.2
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.
(2) The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3) The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
(4) The junction-to-board thermal resistance is obtained by simulating in an environment with a ring cold plate fixture to control the PCB
temperature, as described in JESD51-8.
(5) The junction-to-top characterization parameter, ψ
JT
, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θ
JA
, using a procedure described in JESD51-2a (sections 6 and 7).
(6) The junction-to-board characterization parameter, ψ
JB
, estimates the junction temperature of a device in a real system and is extracted
from the simulation data for obtaining θ
JA
, using a procedure described in JESD51-2a (sections 6 and 7).
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