Datasheet

Not Recommended for New Designs
TUSB8040
www.ti.com
SLLSE42I SEPTEMBER 2010REVISED SEPTEMBER 2013
USB 3.0 Four Port Hub
Check for Samples: TUSB8040
1 PRODUCT OVERVIEW
1.1 Features
1
USB 3.0 Compliant Four Port Hub, TID# 330000003
Upstream Port Supports SuperSpeed, High-Speed and Full-Speed Connections
Each of the Four Downstream Ports Support SuperSpeed, High-Speed, Full-Speed/Low-Speed
Connections
USB 2.0 Hub Features
Multi Transaction Translator (MTT) Hub: Four Transaction Translators, One Per Port
Four (Over USB Required Minimum of Two) Asynchronous Endpoint Buffers Per Transaction
Translator for Better Throughput
Supports Charging Downstream Port (CDP) Applications
Battery Charging 1.2 Compliant
Supports Operation as a USB 3.0 or USB 2.0 Compound Device
Supports Per Port or Ganged Power Switching and Over-Current Protection
Provides the following status outputs:
High-Speed Upstream Connection
High-Speed Upstream Port Suspended
SuperSpeed Upstream Connection
SuperSpeed Upstream Port Suspended
Optional Serial EEPROM or SMBus Slave Interface for Custom Configurations:
VID/PID
Manufacturer and Product Strings
Serial Number
Using Pin Selection or the EEPROM/SMBus Slave Interface, Each Downstream Port Can Be
Independently:
Enabled or Disabled
Marked as Removable or Permanently Attached (for Compound Applications)
Have Battery Charging Enabled or Disabled
Provides 128-Bit Universally Unique Identifier (UUID)
Optionally Supports USB 2.0 Compliant Port Indicator LEDs
Configurable SMBus Address to Support Multiple Devices on the Same SMBus Segment
Supports On-Board and In-System EEPROM Programming Via the USB 2.0 Upstream Port
Single Clock Input, 24-MHz Crystal or Oscillator
No Special Driver Requirements; Works Seamlessly With Any Operating System With USB Stack
Support
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PRODUCTION DATA information is current as of publication date. Products conform to
Copyright © 2010–2013, Texas Instruments Incorporated
specifications per the terms of the Texas Instruments standard warranty. Production
processing does not necessarily include testing of all parameters.