Datasheet

Not Recommended for New Designs
TUSB8040
www.ti.com SLLSE42I –SEPTEMBER 2010–REVISED SEPTEMBER 2013
6.4 3.3-V I/O ELECTRICAL CHARACTERISTICS
over operating free-air temperature range (unless otherwise noted)
PARAMETER OPERATION TEST CONDITIONS MIN MAX UNIT
V
IH
High-level input voltage
(1)
VDD33 2 VDD33 V
0 0.8
V
IL
Low-level input voltage
(1)
VDD33 V
JTAG pins only 0 0.55
V
I
Input voltage 0 VDD33 V
V
O
Output voltage
(2)
0 VDD33 V
t
t
Input transition time (t
rise
and t
fall
) 0 25 ns
V
hys
Input hysteresis
(3)
0.13 x VDD33 V
V
OH
High-level output voltage VDD33 I
OH
= -4 mA 2.4 V
V
OL
Low-level output voltage VDD33 I
OL
= 4 mA 0.4 V
I
OZ
High-impedance, output current
(2)
VDD33 V
I
= 0 to VDD33 ±20 µA
High-impedance, output current with
I
OZP
internal pullup or pulldown VDD33 V
I
= 0 to VDD33 ±225 µA
resistor
(4)
I
I
Input current
(5)
VDD33 V
I
= 0 to VDD33 ±15 µA
(1) Applies to external inputs and bidirectional buffers.
(2) Applies to external outputs and bidirectional buffers.
(3) Applies to GRSTz.
(4) Applies to pins with internal pullups/pulldowns.
(5) Applies to external input buffers.
Copyright © 2010–2013, Texas Instruments Incorporated ELECTRICAL SPECIFICATIONS 25
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