Datasheet
ABSOLUTE MAXIMUM RATINGS
(1)
TSC2007
SBAS405A – MARCH 2007 – REVISED MARCH 2009 ......................................................................................................................................................
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION
(1)
TYPICAL TYPICAL NO MISSING
INTEGRAL GAIN CODES SPECIFIED TRANSPORT
LINEARITY ERROR RESOLUTION PACKAGE PACKAGE TEMPERATURE PACKAGE ORDERING MEDIA,
PRODUCT (LSB) (LSB) (BITS) TYPE DESIGNATOR RANGE MARKING NUMBER QUANTITY
TSC2007IPW Tube, 90
16-Pin,
5 x 6.4 PW – 40 ° C to +85 ° C TSC2007
Tape and
TSC2007IPWR
TSSOP
Reel, 2000
TSC2007I ± 1.5 0.1 11
Small Tape
12-Pin,
TSC2007IYZGT
and Reel, 250
3 x 4 Matrix,
YZG – 40 ° C to +85 ° C TSC2007I
1.5 x 2
Tape and
TSC2007IYZGR
WCSP
Reel, 3000
(1) For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet, or see
the TI website at www.ti.com .
Over operating free-air temperature range (unless otherwise noted).
PRAMETER TSC2007 UNIT
Analog input X+, Y+, AUX to GND – 0.4 to V
DD
+ 0.1 V
Voltage
Analog input X – , Y – to GND – 0.4 to V
DD
+ 0.1 V
Voltage range VDD/REF pin to GND – 0.3 to +5 V
Digital input voltage to GND – 0.3 to V
DD
+ 0.3 V
Digital output voltage to GND – 0.3 to V
DD
+ 0.3 V
Power dissipation (T
J
Max - T
A
)/ θ
JA
TSSOP package 86
Thermal impedance, θ
JA
Low-K 113 ° C/W
WCSP package
High-K 62
Operating free-air temperature range, T
A
– 40 to +85 ° C
Storage temperature range, T
STG
– 65 to +150 ° C
Junction temperature, T
J
Max +150 ° C
Vapor phase (60 sec) +215 ° C
Lead temperature
Infrared (15 sec) +220 ° C
IEC contact discharge
(2)
X+, X – , Y+, Y – ± 15 kV
IEC air discharge
(2)
X+, X – , Y+, Y – ± 25 kV
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to
absolute-maximum rated conditions for extended periods may affect device reliability.
(2) Test method based on IEC standard 61000-4-2. Contact Texas Instruments for test details.
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Product Folder Link(s): TSC2007