Datasheet

ELECTRICAL CHARACTERISTICS
TSC2006
www.ti.com ......................................................................................................................................................... SBAS415C – JUNE 2007 – REVISED MARCH 2009
At T
A
= – 40 ° C to +85 ° C, SNSVDD = V
REF
= +1.2V to +3.6V, I/OVDD
(1)
= +1.2V to +3.6V, unless otherwise noted.
TSC2006
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
AUXILIARY ANALOG INPUT
Input voltage range 0 VREF V
Input capacitance 12 pF
Input leakage current – 1 +1 µ A
A/D CONVERTER
Resolution Programmable: 10 or 12 bits 12 Bits
No missing codes 12-bit resolution 11 Bits
Integral linearity – 3 – 1.2 to 0.7 +3 LSB
(2)
Differential linearity – 0.7 to 0.6 4 LSB
Offset error SNSVDD =1.6V, V
REF
= 1.6V, f
SCLK
= 10MHz, filter off – 5 2.2 +5 LSB
Gain error SNSVDD =1.6V, V
REF
= 1.6V, f
SCLK
= 10MHz, filter off – 3 0.1 +3 LSB
REFERENCE INPUT
V
REF
range 1.2 SNSVDD V
Non-continuous AUX mode, SNSVDD = V
REF
= 1.6V,
VREF input current drain 2.7 µ A
T
A
= +25 ° C, f
ADC
= 2MHz, f
SCLK
= 10MHz
Input impedance A/D converter not converting 1 G Ω
TOUCH SENSORS
PENIRQ 50k Ω pull-up resistor,
T
A
= +25 ° C, SNSVDD = 3V, V
REF
= 2.5V 49 k Ω
R
IRQ
Y+, X+ 6 Ω
Switch
on-resistance
Y – , X – 5 Ω
Switch drivers drive current
(3)
100ms duration 50 mA
INTERNAL TEMPERATURE SENSOR
Temperature range – 40 +85 ° C
SNSVDD = 1.6V 0.3 ° C/LSB
Differential method
(4)
SNSVDD = 3V 1.6 ° C/LSB
Resolution
SNSVDD = 1.6V 0.3 ° C/LSB
TEMP1
(5)
SNSVDD = 3V 1.6 ° C/LSB
SNSVDD = 1.6V ± 3 ° C/LSB
Differential method
(4)
SNSVDD = 3V ± 2 ° C/LSB
Accuracy
SNSVDD = 1.6V ± 3 ° C/LSB
TEMP1
(5)
SNSVDD = 3V ± 2 ° C/LSB
INTERNAL OSCILLATOR
SNSVDD = 1.2V, T
A
= +25 ° C 3.2 MHz
Clock frequency, f
OSC
SNSVDD = 1.6V 3.3 3.7 4.3 MHz
SNSVDD = 3.0V, T
A
= +25 ° C 3.9 MHz
SNSVDD = 12V 0.112 %/ ° C
Frequency drift SNSVDD = 1.6V – 0.009 %/ ° C
SNSVDD = 3.0V – 0.025 %/ ° C
(1) I/OVDD must be ≤ SNSVDD.
(2) LSB means Least Significant Bit. With V
REF
= +2.5V, one LSB is 610 µ V.
(3) Assured by design, but not tested. Exceeding 50mA source current may result in device degradation.
(4) Difference between TEMP1 and TEMP2 measurement; no calibration necessary.
(5) Temperature drift is – 2.1mV/ ° C.
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